Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Nikolai S. Trushkin"'
Publikováno v:
Безопасность информационных технологий, Vol 29, Iss 1, Pp 9-16 (2022)
Currently, there is a tendency to use the hardware means of information protection in extreme operating conditions, in particular, in the presence of powerful radiation. In this regard, the problem of assessing the stability of the hardware means of
Externí odkaz:
https://doaj.org/article/cb51996c58cd4b23b965f91ab75a35cb
Publikováno v:
Безопасность информационных технологий, Vol 25, Iss 1, Pp 34-40 (2018)
The methods of information security, which are based on the use of functional-logical modeling of very large digital integrated circuits (VLSI) under the influence of ionizing radiation are considered. It is shown that the multiplicity of the node an
Externí odkaz:
https://doaj.org/article/dc38af35880046a0bc74003f7769b2a8
Autor:
Nikolai S. Trushkin, V. M. Barbashov
Publikováno v:
Bezopasnostʹ Informacionnyh Tehnologij, Vol 25, Iss 1, Pp 34-40 (2018)
The methods of information security, which are based on the use of functional-logical modeling of very large digital integrated circuits (VLSI) under the influence of ionizing radiation are considered. It is shown that the multiplicity of the node an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f52870262255855ae5f9c945d7bb88f
https://doi.org/10.26583/bit.2018.1.03
https://doi.org/10.26583/bit.2018.1.03
Publikováno v:
IFMBE Proceedings ISBN: 9783030318659
The analysis of the LSI behavior under radiation exposure at functional and logical level of description was carried out. It is shown that there are deterministic and non-deterministic failures typical when exposed to ionizing radiation. In the first
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::df6b720c3e1b15ba564fec350a7e7cc0
https://doi.org/10.1007/978-3-030-31866-6_144
https://doi.org/10.1007/978-3-030-31866-6_144
Publikováno v:
ITM Web of Conferences, Vol 30, p 10003 (2019)
The article presents an analysis of microwave LSI behavior under radiation exposure at the functional-logical level of description. The analysis is based on fuzzy digital automaton and topological probabilistic models of workability assessment. It is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::704528e3f4bb99defc59f9f64f2bd75e
https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_10003.pdf
https://www.itm-conferences.org/articles/itmconf/pdf/2019/07/itmconf_crimico2019_10003.pdf