Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Nikitas Siannas"'
Autor:
Nikitas Siannas, Christina Zacharaki, Polychronis Tsipas, Stefanos Chaitoglou, Laura Bégon-Lours, Cosmin Istrate, Lucian Pintilie, Athanasios Dimoulas
Publikováno v:
Communications Physics, Vol 5, Iss 1, Pp 1-10 (2022)
HfO2-based ferroelectric materials have immense technological potential and so significant attention has been given to improve the ferroelectric properties at low-thickness. Here, using Landau Devonshire theory, the authors show the origin of pinched
Externí odkaz:
https://doaj.org/article/d8003fbe4f6f46ef83a1d175ce3b83cc
Autor:
Polychronis Tsipas, Panagiotis Pappas, Evgenia Symeonidou, Sotirios Fragkos, Christina Zacharaki, Evangelia Xenogiannopoulou, Nikitas Siannas, Athanasios Dimoulas
Publikováno v:
APL Materials, Vol 9, Iss 10, Pp 101103-101103-6 (2021)
One monolayer semimetallic HfTe2 thin films are grown on three substrates with different electronic properties in order to study the substrate effect on the electronic structure of the HfTe2 epilayer. Angle resolved photoelectron spectroscopy measure
Externí odkaz:
https://doaj.org/article/e2e14b9374484c48b005528f37d07b9e
Autor:
Christina Zacharaki, Stefanos Chaitoglou, Nikitas Siannas, Polychronis Tsipas, Athanasios Dimoulas
Publikováno v:
ACS Applied Electronic Materials. 4:2815-2821
Autor:
Evangelia Xenogiannopoulou, Christina Zacharaki, Nikitas Siannas, Panagiotis Pappas, Polychronis Tsipas, Sotirios Fragkos, Evgenia Symeonidou, Athanasios Dimoulas
Publikováno v:
APL Materials, Vol 9, Iss 10, Pp 101103-101103-6 (2021)
APL Materials
APL Materials
One monolayer semimetallic HfTe2 thin films are grown on three substrates with different electronic properties in order to study the substrate effect on the electronic structure of the HfTe2 epilayer. Angle resolved photoelectron spectroscopy measure