Zobrazeno 1 - 10
of 105
pro vyhledávání: '"Nien Fan Zhang"'
Autor:
Franco Pavese, Markus Baer, Alistair B Forbes, Jean-marc Linares, Christophe Perruchet, Nien Fan Zhang
The main theme of the AMCTM 2008 conference, reinforced by the establishment of IMEKO TC21, was to provide a central opportunity for the metrology and testing community worldwide to engage with applied mathematicians, statisticians and software engin
Autor:
Nien Fan Zhang1 zhang@nist.gov
Publikováno v:
International Journal of Production Research. 9/10/2001, Vol. 39 Issue 13, p2769-2781. 13p. 5 Charts, 1 Graph.
Autor:
Nien Fan Zhang
Publikováno v:
Forensic science international. 326
In the branch of forensic science known as firearm evidence identification, various similarity scores have been proposed to compare firearm marks. Some similarity score comparisons, for example, congruent matching cells (CMC) method, are based on pas
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::516c81c1f7422983921355c5c2a264c9
https://pubmed.ncbi.nlm.nih.gov/34314987
https://pubmed.ncbi.nlm.nih.gov/34314987
This volume contains original, refereed contributions by researchers from national metrology institutes, universities and laboratories across the world involved in metrology and testing. The volume has been produced by the International Measurement C
Autor:
Nien Fan Zhang
Publikováno v:
Series on Advances in Mathematics for Applied Sciences
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ff26bbef2a4c22351da21aaecbc77c2d
https://doi.org/10.1142/9789813274303_0011
https://doi.org/10.1142/9789813274303_0011
Publikováno v:
Series on Advances in Mathematics for Applied Sciences ISBN: 9789813274297
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::533d72f7f5a0c8dccac0d2bdd1605ff5
https://doi.org/10.1142/11100
https://doi.org/10.1142/11100
Autor:
Nien Fan Zhang
Publikováno v:
Measurement Science and Technology. 30:065005
In metrology, when repeated measurements are autocorrelated, it is not appropriate to use the traditional approach to evaluate the uncertainty of the average of repeated measurements. In literature, methodologies were developed to evaluate the uncert
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::27a4ba2b0c846e3cfc19f137f7d6c683
https://doi.org/10.1088/1361-6501/ab048e
https://doi.org/10.1088/1361-6501/ab048e
Autor:
Nien Fan Zhang
Publikováno v:
Metrologia. 49:390-394
A statistical analysis for interlaboratory comparisons with linear trends in multiple loops is proposed. This approach can be applied to comparisons with multiple artefacts in multiple loops. The uncertainties for the comparison reference values and
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e52f296943860842b4a1b285d0fd875
https://doi.org/10.1088/0026-1394/49/3/390
https://doi.org/10.1088/0026-1394/49/3/390