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Quantitative mapping of smooth topographic landscapes produced by thermal scanning-probe lithography
Autor:
Sørensen, Camilla H., Nielsen, Magnus V., Linde, Sander J., Nguyen, Duc Hieu, Iversen, Christoffer E., Jensen, Robert, Raza, Søren, Bøggild, Peter, Booth, Timothy J., Lassaline, Nolan
Scanning probe microscopy (SPM) is a powerful technique for mapping nanoscale surface properties through tip-sample interactions. Thermal scanning-probe lithography (tSPL) is an advanced SPM variant that uses a silicon tip on a heated cantilever to s
Externí odkaz:
http://arxiv.org/abs/2410.21176
