Výsledky vyhledávání - "Nicolas Vivet"

Assessing the electrical activity of individual ZnO nanowires thermally annealed in air

Autor: Micka, Bah, Taoufik Slimani, Tlemcani, Sarah, Boubenia, Camille, Justeau, Nicolas, Vivet, Jean-Michel, Chauveau, François, Jomard, Kevin, Nadaud, Guylaine, Poulin-Vittrant, Daniel, Alquier

Publikováno v: Nanoscale advances. 4(4)

ZnO nanowires (NWs) are very attractive for a wide range of nanotechnological applications owing to their tunable electron concentration

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=pmid________::2ce3bb00fc588ea577737d734dc06826
https://pubmed.ncbi.nlm.nih.gov/36131772

Zobrazit plný text záznamu

Use of golden samples for the assessment of the quality and reproducibility of scanning acoustic microscopy images of electronics samples

Autor: Nicolas Porcher, Michael Hertl, Fabien Allanic, Isaline Richard, Pauline Serre, Sandra Dureau, Nicolas Vivet, Armelle Minguet

Publikováno v: Microelectronics Reliability. :282-287

Scanning Acoustic Microscopy (SAM) is a widely used technology for non-destructive failure analysis in electronics samples. The primary information generated by SAM is a grey scale image, which is the basis for the interpretation by the failure analy

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::3b5ebab0cce0ed70f96e46a0578292bc
https://doi.org/10.1016/j.microrel.2018.07.052

Zobrazit plný text záznamu

Electrical Homo-Junction Delineation Techniques: A Comparative Study

Autor: Mélanie Diogo, Jean-Paul Rebrassé, Raphael Perdreau, Fabien Allanic, Tony Moinet, Nicolas Vivet, Amandine Aubert

Publikováno v: Materials Sciences and Applications. :326-347

In active semiconductor devices, the junction characteristics are critical for the electrical performance. As an alternative of the atomic force microscopy (AFM)-based electrical techniques which provide unique junction characterization, other method

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::76d24224cd7a71502c91f5dc4338e64f
https://doi.org/10.4236/msa.2016.76030

Zobrazit plný text záznamu

Quantitative analysis of porosity and transport properties by FIB-SEM 3D imaging of a solder based sintered silver for a new microelectronic component

Autor: T. Le Bihan, S. Chupin, Wafaa Rmili, Caroline Richard, G. Le Quilliec, Nicolas Vivet

Publikováno v: Journal of Electronic Materials
Journal of Electronic Materials, 2016, 45 (4), pp.2242-2251. ⟨10.1007/s11664-015-4288-1⟩
Journal of Electronic Materials, Institute of Electrical and Electronics Engineers, 2016, 45 (4), pp.2242-2251. ⟨10.1007/s11664-015-4288-1⟩

International audience; As part of development of a new assembly technology to achieve bonding for an innovative silicon carbide (SiC) power device used in harsh environments, the aim of this study is to compare two silver sintering profiles and then

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9039847c424ac048499d533d80ddb6fd
https://hal.science/hal-01333197

Zobrazit plný text záznamu

Reliability in Power Modules Die Attach: A Comprehensive Evolution of the Nanocrystalline Silver Sintering Physical Properties Versus its Porosity

Autor: Toni Youssef, Wafaa Rmili, Eric Woirgard, Stephane Azzopardi, Nicolas Vivet, Donatien Martineau, Régis Meuret, Guenhael Le Quilliec, Caroline Richard

Publikováno v: 26th European Symposium on Reliability of Electron Devices
26th European Symposium on Reliability of Electron Devices, Oct 2015, Toulouse, France
HAL

International audience

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::ac9d5da8ed3fefa5233260dc563a7b27
https://hal.archives-ouvertes.fr/hal-01333190

Zobrazit plný text záznamu

Power modules die attach: A comprehensive evolution of the nanosilver sintering physical properties versus its porosity

Autor: Régis Meuret, Caroline Richard, Eric Woirgard, Donatien Martineau, Wafaa Rmili, G. Le Quilliec, Stephane Azzopardi, Toni Youssef, Nicolas Vivet

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, 2015, 55 (9-10), pp.1997-2002. ⟨10.1016/j.microrel.2015.06.085⟩
Microelectronics Reliability, Elsevier, 2015, 55 (9-10), pp.1997-2002. ⟨10.1016/j.microrel.2015.06.085⟩

International audience; Along with the need to drastically limit the emission of greenhouse gases, the increase of electric or hybrid solutions in the market mostly relies on their dependability with a specific focus on reliability of the embedded po

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::a453f4145b6af53fa9a9b87986e7e8cb
https://hal.science/hal-01333171

Zobrazit plný text záznamu

Structural and photoluminescence properties of Cr2+:ZnSe films deposited by radiofrequency magnetron co-sputtering for mid-infrared microlaser applications

Autor: M. Levalois, Jean-Louis Doualan, Nicolas Vivet, Xavier Portier, Magali Morales

Publikováno v: Materials Science and Engineering: B
Materials Science and Engineering: B, 2008, 146, pp.236-240
Materials Science and Engineering: B, Elsevier, 2008, 146, pp.236-240

International audience; Highly crystallised Cr2+:ZnSe cubic films with a strong orientation were deposited at room temperature by radiofrequency magnetron co-sputtering. The effect of the sputtering power and the chromium quantity on the structural a

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::e324451645759e6e1492bbbad28982d2
https://cea.hal.science/cea-00374035

Zobrazit plný text záznamu

Vyhledávací nástroje:

Upřesnit hledání