On the Correlation Between Near-Field Scan Immunity and Radiated Immunity at Printed Circuit Board Level – Part II

Autor: Alexandre Boyer, Nicolas Nolhier, Fabrice Caignet, Sonia Ben Dhia

Publikováno v: IEEE Transactions on Electromagnetic Compatibility
IEEE Transactions on Electromagnetic Compatibility, 2022, 64 (5), pp.1493-1505. ⟨10.1109/TEMC.2022.3172601⟩

International audience; The work presented in this two-part paper focuses on a prediction method of the radiated susceptibility of integrated circuit and printed circuit board from near-field scan injection, in order to anticipate risks of non-compli

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f63def7382a7ed32a903777c39460a99
https://doi.org/10.1109/temc.2022.3172601

Anticipating Common-Mode Conducted Emission of DC-DC Converter from Electric Near-Field Scan

Autor: A. Boyer, Nicolas Nolhier, S. Ben Dhia, Fabrice Caignet

Publikováno v: 2021 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY, AND EMC EUROPE
2021 JOINT IEEE INTERNATIONAL SYMPOSIUM ON ELECTROMAGNETIC COMPATIBILITY, SIGNAL & POWER INTEGRITY, AND EMC EUROPE, Jul 2021, Glasgow (virtuel), United Kingdom. ⟨10.1109/EMC/SI/PI/EMCEurope52599.2021.9559364⟩

International audience; This paper aims at proposing a method based on electric near-field measurement to estimate common-mode conducted emission produced by DC-DC converter along a cable harness. The method is evaluated on two case studies: an acade

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::37a25bcc89749017f6ff7843b5c5c0f3
https://hal.laas.fr/hal-03321009

ESD Protection Methodologies : From Component to System

Autor: Marise Bafleur, Fabrice Caignet, Nicolas Nolhier

Failures caused by electrostatic discharges (ESD) constitute a major problem concerning the reliability and robustness of integrated circuits and electronic systems. This book summarizes the many diverse methodologies aimed at ESD protection and show

Prediction of LIN communication robustness against EFT events using dedicated failure models

Autor: Fabrice Caignet, Nicolas Nolhier, Frédéric Escudié, Marise Bafleur

Publikováno v: Microelectronics Reliability
Microelectronics Reliability, Elsevier, 2017, 76-77, pp.685-691. ⟨10.1016/j.microrel.2017.07.032⟩
Microelectronics Reliability, 2017, 76-77, pp.685-691. ⟨10.1016/j.microrel.2017.07.032⟩

International audience; During its life, an automotive application can encounter several perturbations such as fast transient of ESD discharges. In this paper, we propose a LIN transceiver behavior model to predict both hard and soft failures within

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::89c0c3535644debd036d1095683774bc
https://hal.laas.fr/hal-01698397/document

Case Studies

Autor: Marise Bafleur, Fabrice Caignet, Nicolas Nolhier

In this chapter, we describe several case studies that have been analyzed at LAAS-CNRS within the context of PhD theses and with our industrial partners. These concern both integrated circuits and electronic systems on boards.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::ae7236216adb5dd332de06241a543d15
https://doi.org/10.1016/b978-1-78548-122-2.50005-4