Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Nicolas Gagliolo"'
Publikováno v:
Proceedings of the 20th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Magnetic Field Imaging (MFI) technology is capable of localize shorts using Magnetic Current Imaging (MCI) technique with a very high spatial resolution [1]. In this paper we demonstrate that a Giant Magneto Resistance (GMR) sensor positioned in clos
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::745ca351ed83c99b0a51f61c83e9c163
https://doi.org/10.1109/ipfa.2013.6599179
https://doi.org/10.1109/ipfa.2013.6599179
Autor:
David P. Vallett, Vladimir V. Talanov, Antonio Orozco, Daniel A. Bader, Nicolas Gagliolo, Jan Gaudestad
Publikováno v:
International Symposium for Testing and Failure Analysis.
Space Domain Reflectometry (SDR) is a newly developed non-destructive failure analysis (FA) technique for localizing open defects in both packages and dies through mapping in space domain the magnetic field produced by a radio frequency (RF) current
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2788be1556283c5f0cab3b5ae30c2e66
https://doi.org/10.31399/asm.cp.istfa2012p0017
https://doi.org/10.31399/asm.cp.istfa2012p0017
Autor:
A.B. Cawthorne, Valery Borzenets, Antonio Orozco, Nesco Lettsome, Vladimir Talanov, Nicolas Gagliolo
Publikováno v:
Superconductor Science and Technology. 27:044032
We developed a scanning DC SQUID microscope with novel readout electronics capable of wideband sensing of RF magnetic fields from 50 to 200 MHz and simultaneously providing closed-loop response at kHz frequencies. To overcome the 20 MHz bandwidth lim
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d22cb72b5844bf2e85108d6175bb22bb
https://doi.org/10.1088/0953-2048/27/4/044032
https://doi.org/10.1088/0953-2048/27/4/044032
Publikováno v:
2012 19th IEEE International Symposium on the Physical & Failure Analysis of Integrated Circuits; 1/ 1/2012, p1-5, 5p
Autor:
EDFAS Organizing Committee
This title features the latest research and practical data from the premier event for the microelectronics failure analysis community. The papers cover a wide range of testing and failure analysis topics of practical value to anyone working to detect
