Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Nicolas Brynaert"'
Autor:
Felix Latourte, Nicolas Brynaert, Stéphane Roux, Qiwei Shi, François Hild, Dominique Loisnard
Publikováno v:
Ultramicroscopy
Ultramicroscopy, Elsevier, 2018, 191, pp.18-33. ⟨10.1016/j.ultramic.2018.04.006⟩
Ultramicroscopy, Elsevier, 2018, 191, pp.18-33. ⟨10.1016/j.ultramic.2018.04.006⟩
International audience; The present study extends the stereoscopic imaging principle for estimating the surface topography to two orientations, namely, normal to the electron beam axis and inclined at 70° as suited for EBSD analyses. In spite of the
Autor:
Felix Latourte, Qiwei Shi, Nicolas Brynaert, Dominique Loisnard, Stéphane Roux, François Hild
Publikováno v:
Ultramicroscopy
Ultramicroscopy, Elsevier, 2018, 184, Part A, pp.71-87. ⟨10.1016/j.ultramic.2017.08.005⟩
Ultramicroscopy, Elsevier, 2018, 184, Part A, pp.71-87. ⟨10.1016/j.ultramic.2017.08.005⟩
International audience; In situ SEM mechanical tests are key to study crystal plasticity. In particular, imaging and diffraction (EBSD) allow microstructure and surface kinematics to be monitored all along the test. However, to get a full benefit fro
Autor:
Marc Beumier, Nicolas Brynaert
Publikováno v:
Courrier hebdomadaire du CRISP. :5
Les etablissements scientifiques federaux sont certainement la branche la moins bien connue de la fonction publique federale. C’est pourtant une des plus anciennes puisque la creation des Archives generales du Royaume remonte a 1796. Les etablissem
Autor:
Kinda, Justin, Bourdot, Alexandra, Charpin, Laurent, Michel-Ponnelle, Sylvie, Benboudjema, Farid
Publikováno v:
Journal of Materials in Civil Engineering; Mar2022, Vol. 34 Issue 3, p1-14, 14p
Characterization of SEM speckle pattern marking and imaging distortion by digital image correlation.
Publikováno v:
Measurement Science & Technology; Jan2014, Vol. 25 Issue 1, p015401-015412, 12p
Publikováno v:
Measurement Science & Technology; Sep2016, Vol. 27 Issue 9, p1-1, 1p
Autor:
François Willot, Samuel Forest
Dominique Jeulin has been Director of Research and Professor at École des Mines de Paris, which he joined in 1986. He previously worked at IRSID, where he developed image analysis for materials of steel industry. At École des Mines, he was at the h