Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Nicolas Berchenko"'
Publikováno v:
Applied Surface Science. 577:151855
Molecular speciation by Time of Flight Secondary Ion Mass Spectrometry (TOF SIMS) was applied to oxidized bismuth, lead, tin, and tellurium. In their pure elemental form, they are basic constituent elements of both topological insulators and topologi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d66fe7961007be02a373c6bbcfd6f097
https://doi.org/10.1016/j.apsusc.2021.151855
https://doi.org/10.1016/j.apsusc.2021.151855
Autor:
R. Wojnarowska-Nowak, Andrzej Szczerbakow, A. Badyla, Nicolas Berchenko, R. Vitchev, Malgorzata Trzyna, Tomasz Story, Jozef Cebulski
Publikováno v:
Applied Surface Science. 452:134-140
The composition of oxide layers that grow under air exposure at room temperature on the surface of SnTe monocrystals was studied by Raman spectroscopy, angle resolved X-ray photoelectron spectroscopy (ARXPS), and Time Of Flight Secondary Ion Mass Spe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::580580cac5bb27c35937fa61943a8d43
https://doi.org/10.1016/j.apsusc.2018.04.246
https://doi.org/10.1016/j.apsusc.2018.04.246
Autor:
S. Adamiak, Nicolas Berchenko, R. Vitchev, Jozef Cebulski, A. Dziedzic, Wojciech Bochnowski, Malgorzata Trzyna
Publikováno v:
Corrosion Science. 108:205-208
Ni superalloys have found broad application, but service conditions may influence their composition. X-ray photoelectron and secondary ion mass spectroscopies detected molybdenum oxides in the subsurface layer of air-annealed Ni-Cr-Fe-based superallo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2c92a0e38197e87f6b461f8cd9a74364
https://doi.org/10.1016/j.corsci.2016.03.014
https://doi.org/10.1016/j.corsci.2016.03.014
Autor:
Maciej Kozubal, Rafal Jakiela, Jozef Cebulski, Piotr Dziawa, Malgorzata Trzyna, Nicolas Berchenko
Publikováno v:
International Journal of Mass Spectrometry. 422:143-145
Present study considers the possibility of using high-mass clusters ions detected by TOF-SIMS for the depth profiling of implanted atoms. The Te and Se samples were implanted with the Bi+ ions at the energy of 500 keV to a fluence of 1 × 1015 cm−2
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d06d4aa3a66944f0d7547b532f9d6204
https://doi.org/10.1016/j.ijms.2017.08.003
https://doi.org/10.1016/j.ijms.2017.08.003
Autor:
Sergey Fadeyev, Wojciech Bochnowski, Malgorzata Trzyna, Josef Cebulski, S. Adamiak, Nicolas Berchenko, A. Dziedzic
Publikováno v:
Thin Solid Films. 591:311-315
Time-of-flight secondary ion mass spectrometry profiling, scanning transmission electron microscopy, and energy dispersive X-ray mapping were used to investigate physical and chemical processes on the surface of a precipitation-hardenable nickel–ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4e82209d9a77f409566a3228879366bb
https://doi.org/10.1016/j.tsf.2015.03.020
https://doi.org/10.1016/j.tsf.2015.03.020
Autor:
Wojciech Bochnowski, S. Adamiak, A. Dziedzic, Malgorzata Trzyna, Jozef Cebulski, D. Sakseev, Nicolas Berchenko
Publikováno v:
Thin Solid Films. 591:346-350
Nanostructures based on PbTe seem promising for production of thermoelectric converters. However surface oxidation of nanoparticles that occurs during the manufacturing processes can significantly change the nanocrystals' dimensions and properties. T
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d6e4a80f6687495d137908550d979173
https://doi.org/10.1016/j.tsf.2015.04.088
https://doi.org/10.1016/j.tsf.2015.04.088
Autor:
Volodymyr Savchyn, Jozef Cebulski, Sergey Fadeev, Malgorzata Trzyna, Nicolas Berchenko, Kurban Kurbanov
Publikováno v:
Thermochimica Acta. 579:64-69
To clarify the behavior of thermally oxidized PbTe the phase equilibrium diagram was calculated taking into account the change of the standard Gibbs energies of formation with the temperature up to 873 K. The X-ray diffractometry (XRD) studies of the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6c3b49c82963f456c848bd167d24c56e
https://doi.org/10.1016/j.tca.2013.12.004
https://doi.org/10.1016/j.tca.2013.12.004
Publikováno v:
Surface and Interface Analysis. 42:966-969
The composition of the oxide and oxide-semiconductor interface of HgZnTe and HgMnTe alloys was analyzed by the method of equilibrium condensed phase diagrams, and experimentally studied by X-ray diffractometry (XRD) and reflection high-energy electro
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70461b7db0ea0a6d76af8847bd7657a8
https://doi.org/10.1002/sia.3481
https://doi.org/10.1002/sia.3481
Publikováno v:
European journal of mass spectrometry (Chichester, England). 20(6)
The regularity of Bi+, Bi3+ and Bi3++ primary ions in the time-of-flight secondary ion mass spectroscopy fragment pattern of air oxidized Te and Bi+ direct-current scan cleaned Te is discussed. The most intensive fragments for a cleaned Te surface ar
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::056abf24d303f140b07cc36be214d7e5
https://pubmed.ncbi.nlm.nih.gov/25905867
https://pubmed.ncbi.nlm.nih.gov/25905867
Publikováno v:
Surface and Coatings Technology. :732-736
The mechanism of p-to-n type conductivity conversion under ion beam milling (IBM) in extrinsically (As or Sb)-doped p-Cd x Hg 1-x Te with x0.2 both experimentally and theoretically was studied. It has been experimentally revealed that the character o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c4c8b8524f71413e4f777f00f87f561c
https://doi.org/10.1016/s0257-8972(02)00264-5
https://doi.org/10.1016/s0257-8972(02)00264-5