Zobrazeno 1 - 10
of 578
pro vyhledávání: '"Nicolaidis, M."'
Autor:
Kolonis, E., Nicolaidis, M.
Publikováno v:
Dans European Nano Systems Worshop - ENS 2006, Paris : France (2006)
Silicon-based CMOS technologies are predicted to reach their ultimate limits by the middle of the next decade. Research on nanotechnologies is actively conducted, in a world-wide effort to develop new technologies able to maintain the Moore's law. Th
Externí odkaz:
http://arxiv.org/abs/0708.1455
Autor:
Kolonis, E., Nicolaidis, M.
Publikováno v:
In Microelectronics Journal August 2008 39(8):1032-1040
Autor:
Lorena Anghel, Nicolaidis, M.
Publikováno v:
Cross-Layer Reliability of Computing Systems
Cross-Layer Reliability of Computing Systems, iet-the institution of engineering and technology, pp.23-42, 2020
HAL
Cross-Layer Reliability of Computing Systems, iet-the institution of engineering and technology, pp.23-42, 2020
HAL
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a6ebf365c9978bc2a2f90c994db42021
https://hal.archives-ouvertes.fr/hal-02986823
https://hal.archives-ouvertes.fr/hal-02986823
Akademický článek
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FIT Rate Calculation and Mitigation Techniques for Advanced Technologies and Automotive Applications
Publikováno v:
3rd IEEE International Workshop on Automotive Reliability & Test (ART'2018)
3rd IEEE International Workshop on Automotive Reliability & Test (ART'2018), Nov 2018, Phoenix (AZ), United States
3rd IEEE International Workshop on Automotive Reliability & Test (ART'2018), Nov 2018, Phoenix (AZ), United States
International audience
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7c1e495ef4df070a3db493aa442f452b
https://hal.archives-ouvertes.fr/hal-02010444
https://hal.archives-ouvertes.fr/hal-02010444
Autor:
Papavramidou, P., Nicolaidis, M.
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2018, ⟨10.1109/TCAD.2018.2887052⟩
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, IEEE, 2018, ⟨10.1109/TCAD.2018.2887052⟩
International audience; In modern SoCs embedded memories should be protected by ECC against field failures to achieve acceptable reliability. They should also be repaired after fabrication to achieve acceptable fabrication yield, as well as during li
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::16cb6a85c7a50ea593061692aa0afec8
https://hal.archives-ouvertes.fr/hal-02006483
https://hal.archives-ouvertes.fr/hal-02006483
GNOCS: an ultra-fast, highly extensible, cycle-accurate GPU-Based parallel Network-on-Chip simulator
Publikováno v:
Design, Automation & Test in Europe Conference, Univ.Booth (DATE 2017)
Design, Automation & Test in Europe Conference, Univ.Booth (DATE 2017), Mar 2017, Lausanne, Switzerland
Design, Automation & Test in Europe Conference, Univ.Booth (DATE 2017), Mar 2017, Lausanne, Switzerland
International audience; With the continuous decrease in feature sizes and the recent emergence of 3D stacking, chips comprising thousands of nodes are becoming increasingly relevant, and state-of-the-art NoC simulators are unable to simulate such a h
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::ce9c047091786874bf55c8754e757360
https://hal.archives-ouvertes.fr/hal-01524080
https://hal.archives-ouvertes.fr/hal-01524080
Publikováno v:
ieee, 17, n° 1, pp.1-2, 2017, ⟨10.1109/TDMR.2017.2671248⟩
International audience; This Special Section of IEEE Transactions on Device and Materials Reliability includes a collection of the best papers of the latest (2016) edition of an established IEEE symposium which focuses for more than two decades on th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::1c49d335ad41e06d143dc83659b93a9d
https://hal.archives-ouvertes.fr/hal-02011795
https://hal.archives-ouvertes.fr/hal-02011795