Zobrazeno 1 - 2
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pro vyhledávání: '"Nicola Nicosia"'
Autor:
Fabio Principato, Giuseppe Allegra, Corrado Cappello, Olivier Crepel, Nicola Nicosia, Salvatore D′Arrigo, Vincenzo Cantarella, Alessandro Di Mauro, Leonardo Abbene, Marcello Mirabello, Francesco Pintacuda
Publikováno v:
Sensors, Vol 21, Iss 16, p 5627 (2021)
High temperature reverse-bias (HTRB), High temperature gate-bias (HTGB) tests and electrical DC characterization were performed on planar-SiC power MOSFETs which survived to accelerated neutron irradiation tests carried out at ChipIr-ISIS (Didcot, UK
Externí odkaz:
https://doaj.org/article/d75b44dcd93c44b88ed42af48a3d7339
Autor:
Nicola Nicosia, O. Crepel, Vincenzo Cantarella, Salvatore D′Arrigo, Corrado Cappello, Fabio Principato, Francesco Pintacuda, Marcello Mirabello, Leonardo Abbene, Giuseppe Allegra, Alessandro Di Mauro
Publikováno v:
Sensors (Basel, Switzerland)
Sensors, Vol 21, Iss 5627, p 5627 (2021)
Sensors
Volume 21
Issue 16
Sensors, Vol 21, Iss 5627, p 5627 (2021)
Sensors
Volume 21
Issue 16
High temperature reverse-bias (HTRB), High temperature gate-bias (HTGB) tests and electrical DC characterization were performed on planar-SiC power MOSFETs which survived to accelerated neutron irradiation tests carried out at ChipIr-ISIS (Didcot, UK
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f0037fc5da6b876e4ac64c39109980e
https://doi.org/10.3390/s21165627
https://doi.org/10.3390/s21165627