Zobrazeno 1 - 10
of 131
pro vyhledávání: '"Nicola Nicolici"'
Autor:
Nicola Nicolici
Publikováno v:
IEEE Design & Test. 40:64-67
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::06682d004210dea165338c8e7446f1f1
https://doi.org/10.1109/mdat.2023.3250618
https://doi.org/10.1109/mdat.2023.3250618
Autor:
Nicola Nicolici
Publikováno v:
IEEE Design & Test. 40:112-115
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7a2d45151ce3dd1c885cbc5a890403e5
https://doi.org/10.1109/mdat.2022.3221921
https://doi.org/10.1109/mdat.2022.3221921
Autor:
Nicola Nicolici, Trevor E. Pogue
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 28:750-763
This article presents a new fault analysis technique against cryptographic devices called the incremental fault analysis (IFA), which can be adapted into fault attacks using more traditional differential fault analysis (DFA) techniques in order to in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6cda693cd2f65a8892e1c30710a92de0
https://doi.org/10.1109/tvlsi.2019.2947202
https://doi.org/10.1109/tvlsi.2019.2947202
Autor:
Nicola Nicolici, Amin Vali
Publikováno v:
ETS
Since integrating memory blocks on-chip became affordable, embedded logic analysis has been used extensively for post-silicon validation and debugging. Deciding at design time which signals to be traceable at the post-silicon phase, has been posed as
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0dfb5aa190b146f1898f111e464722d2
https://doi.org/10.1109/tcad.2017.2729458
https://doi.org/10.1109/tcad.2017.2729458
Autor:
Nicola Nicolici, Pouya Taatizadeh
Publikováno v:
IEEE Transactions on Very Large Scale Integration (VLSI) Systems. 25:1866-1880
The objective of post-silicon validation is to identify design errors that remain undetected after pre-silicon verification and, therefore, manifest themselves in the silicon prototypes. These errors are often associated with the subtle interactions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11827b1b2a6fd3b1f2c86aeb06412247
https://doi.org/10.1109/tvlsi.2017.2658564
https://doi.org/10.1109/tvlsi.2017.2658564
Autor:
Xiaobing Shi, Nicola Nicolici
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35:1012-1025
Post-silicon validation is critical for exposing subtle design errors that have escaped to the silicon prototypes. Its effectiveness is conditioned by in-system application of a large volume of functionally-compliant stimuli. In this paper, we presen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94c75bad5cafbc5be04aa10fa37343f8
https://doi.org/10.1109/tcad.2015.2481874
https://doi.org/10.1109/tcad.2015.2481874
Autor:
Pouya Taatizadeh, Nicola Nicolici
Publikováno v:
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems. 35:2118-2130
Post-silicon validation deals with detection and diagnosis of errors that, due to existing limitations in pre-silicon verification, escape to the silicon prototypes and need to be fixed before committing to high-volume manufacturing. Electrical error
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0048abeb178c69e2dfd5391c183c741
https://doi.org/10.1109/tcad.2016.2538087
https://doi.org/10.1109/tcad.2016.2538087
Autor:
Nicola Nicolici, Pouya Taatizadeh
Publikováno v:
Post-Silicon Validation and Debug ISBN: 9783319981154
Post-silicon validation is an important and time-consuming step in the design flow of system-on-chip (SoC) devices. Electrical errors such as those caused by cross-talk or power droops, are particularly difficult to catch during the pre-silicon phase
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c63bba30c087c3436df742672d991b3e
https://doi.org/10.1007/978-3-319-98116-1_10
https://doi.org/10.1007/978-3-319-98116-1_10
Autor:
Nicola Nicolici, Xiaobing Shi
Publikováno v:
Post-Silicon Validation and Debug ISBN: 9783319981154
Post-silicon validation lacks controllability, which is taken for granted during pre-silicon verification. Its effectiveness is conditioned by the in-system application of a large volume of functionally compliant stimuli. In this chapter, the technic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::70ab1eaecce445e6d7e0f1cee855681b
https://doi.org/10.1007/978-3-319-98116-1_8
https://doi.org/10.1007/978-3-319-98116-1_8
Autor:
Pouya Taatizadeh, Nicola Nicolici
Publikováno v:
2017 IEEE/ACM International Conference on Computer-Aided Design (ICCAD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::687034873ef7c01242b75586c616c068
https://doi.org/10.1109/iccad.2017.8203766
https://doi.org/10.1109/iccad.2017.8203766