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pro vyhledávání: '"Nicolás Landeros Muñoz"'
Publikováno v:
Zaguán. Repositorio Digital de la Universidad de Zaragoza
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Negative Bias Temperature Instability (NBTI) and Hot Carrier Injection (HCI) are two of the main reliability threats in current technology nodes. These aging phenomena degrade the transistor''s threshold voltage (Vth) over the lifetime of a digital c