Výsledky vyhledávání - "Nico Klingner"

Akademický článek

A low-kiloelectronvolt focused ion beam strategy for processing low-thermal-conductance materials with nanoampere currents

Autor: Annalena Wolff, Nico Klingner, William Thompson, Yinghong Zhou, Jinying Lin, Yin Xiao

Publikováno v: Beilstein Journal of Nanotechnology, Vol 15, Iss 1, Pp 1197-1207 (2024)

Ion beam-induced heat damage in thermally low conductive specimens such as biological samples is gaining increased interest within the scientific community. This is partly due to the increased use of FIB-SEMs in biology as well as the development of

Externí odkaz: https://doaj.org/article/5444b574d19f4945a510c48f398325ff

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Akademický článek

Universal radiation tolerant semiconductor

Autor: Alexander Azarov, Javier García Fernández, Junlei Zhao, Flyura Djurabekova, Huan He, Ru He, Øystein Prytz, Lasse Vines, Umutcan Bektas, Paul Chekhonin, Nico Klingner, Gregor Hlawacek, Andrej Kuznetsov

Publikováno v: Nature Communications, Vol 14, Iss 1, Pp 1-8 (2023)

Abstract Radiation tolerance is determined as the ability of crystalline materials to withstand the accumulation of the radiation induced disorder. Nevertheless, for sufficiently high fluences, in all by far known semiconductors it ends up with eithe

Externí odkaz: https://doaj.org/article/52702cecbf87439db6e4bf134f8f58db

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Akademický článek

Wafer-scale nanofabrication of telecom single-photon emitters in silicon

Autor: Michael Hollenbach, Nico Klingner, Nagesh S. Jagtap, Lothar Bischoff, Ciarán Fowley, Ulrich Kentsch, Gregor Hlawacek, Artur Erbe, Nikolay V. Abrosimov, Manfred Helm, Yonder Berencén, Georgy V. Astakhov

Publikováno v: Nature Communications, Vol 13, Iss 1, Pp 1-7 (2022)

The recently demonstrated approaches to fabrication of quantum emitters in silicon result in their random positioning, hindering applications in quantum photonic integrated circuits. Here the authors demonstrate controlled fabrication of telecom-wave

Externí odkaz: https://doaj.org/article/b8c7ab778e4c433fa79c319ec012e374

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Akademický článek

Scanning transmission imaging in the helium ion microscope using a microchannel plate with a delay line detector

Autor: Eduardo Serralta, Nico Klingner, Olivier De Castro, Michael Mousley, Santhana Eswara, Serge Duarte Pinto, Tom Wirtz, Gregor Hlawacek

Publikováno v: Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1854-1864 (2020)

A detection system based on a microchannel plate with a delay line readout structure has been developed to perform scanning transmission ion microscopy (STIM) in the helium ion microscope (HIM). This system is an improvement over other existing appro

Externí odkaz: https://doaj.org/article/f4f4ae635b1f46f4abb6e33bc0548f7d

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Akademický článek

Imaging and milling resolution of light ion beams from helium ion microscopy and FIBs driven by liquid metal alloy ion sources

Autor: Nico Klingner, Gregor Hlawacek, Paul Mazarov, Wolfgang Pilz, Fabian Meyer, Lothar Bischoff

Publikováno v: Beilstein Journal of Nanotechnology, Vol 11, Iss 1, Pp 1742-1749 (2020)

While the application of focused ion beam (FIB) techniques has become a well-established technique in research and development for patterning and prototyping on the nanometer scale, there is still a large underused potential with respect to the usage

Externí odkaz: https://doaj.org/article/d73b8a7ab9a74a96ac524d3067633dc3

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Akademický článek

Stationary beam full-field transmission helium ion microscopy using sub-50 keV He+: Projected images and intensity patterns

Autor: Michael Mousley, Santhana Eswara, Olivier De Castro, Olivier Bouton, Nico Klingner, Christoph T. Koch, Gregor Hlawacek, Tom Wirtz

Publikováno v: Beilstein Journal of Nanotechnology, Vol 10, Iss 1, Pp 1648-1657 (2019)

A dedicated transmission helium ion microscope (THIM) for sub-50 keV helium has been constructed to investigate ion scattering processes and contrast mechanisms, aiding the development of new imaging and analysis modalities. Unlike a commercial heliu

Externí odkaz: https://doaj.org/article/9bf3d0611bd0418d93fc4866c7dac24f

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Epitaxial Lateral Overgrowth of Tin Spheres Driven and Directly Observed by Helium Ion Microscopy

Autor: Nico Klingner, Karl-Heinz Heinig, David Tucholski, Wolfhard Möller, René Hübner, Lothar Bischoff, Gregor Hlawacek, Stefan Facsko

Publikováno v: Journal of Physical Chemistry Letters 126(2022), 16332-16340

Enhanced interstitial diffusion in tin is a phenomenon often observed during ion-beam irradiation and in lead-free solders. For the latter, this not very well understood, strain-driven mechanism results in the growth of whiskers, which can lead to un

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_dedup___::5aca01e937ae05f92ca8c9738c01dd76
https://doi.org/10.1021/acs.jpcc.2c03707

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