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Autor:
Nicklaw, Christopher J
Oxygen vacancies have long been known to be the dominant intrinsic defect in amorphous SiO2. They exist, in concentrations dependent on processing conditions, as neutral defects in thermal oxides without usually causing any significant deleterious ef
Autor:
Nicklaw, Christopher J.
Thesis (Ph. D. in Electrical Engineering)--Vanderbilt University, Aug. 2003.
Title from title screen. Includes bibliographical references.
Title from title screen. Includes bibliographical references.