Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Nick Yu-Min Shen"'
Publikováno v:
IEEE Transactions on Dielectrics and Electrical Insulation. 12:1082-1087
A new characterization method for charge conditions in electret polymer films is proposed. This method uses the change of the threshold voltage in an EEPROM (electrically erasable and programmable read-only memory) device to evaluate the effective ch
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::be375ab3edee11b32c5635150cb0c4d1
https://doi.org/10.1109/tdei.2005.1522200
https://doi.org/10.1109/tdei.2005.1522200
Publikováno v:
Sensors and Actuators B: Chemical. 102:35-43
An integration of chemical sensors and electrowetting actuators based on the chemoreceptive neuron MOS (CνMOS) transistors has brought forth a novel system-on-chip approach to the microfluidic system. The extended floating-gate structure of the CνM
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::93ee1188f531182bd127daa6d030d4e2
https://doi.org/10.1016/j.snb.2003.10.013
https://doi.org/10.1016/j.snb.2003.10.013
Publikováno v:
IEEE Transactions on Electron Devices. 50:2171-2178
A novel chemoreceptive neuron MOS (C/spl nu/MOS) transistor with an extended floating-gate structure has been designed with several individual features that significantly facilitate system integration of chemical sensing. We have fabricated C/spl nu/
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f41dee9c3e89689cc83fa8f85c6ebab
https://doi.org/10.1109/ted.2003.816905
https://doi.org/10.1109/ted.2003.816905
Publikováno v:
Technical Digest. MEMS 2002 IEEE International Conference. Fifteenth IEEE International Conference on Micro Electro Mechanical Systems (Cat. No.02CH37266).
This paper demonstrates, for the first time, electrostatic repulsion forces between two isolating beams as a viable actuation mechanism in MEMS applications by nonvolatile charge injection. Devices integrating MEMS beams and EEPROM structures have be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3075abda7254e889a35a73e0ec33528
https://doi.org/10.1109/memsys.2002.984342
https://doi.org/10.1109/memsys.2002.984342
Autor:
Nick Yu-Min Shen, James1 ys69@cornell.edu, Zengtao Liu1, Chungho Lee1, Minch, Bradley A.1, Edwin Chih-Chuan Kan1
Publikováno v:
IEEE Transactions on Electron Devices. Oct2003, Vol. 50 Issue 10, p2171-2178. 8p. 3 Black and White Photographs, 3 Diagrams, 3 Charts, 9 Graphs.
Publikováno v:
IEEE Transactions on Dielectrics & Electrical Insulation. Oct2005, Vol. 12 Issue 5, p1082-1087. 6p.