Zobrazeno 1 - 10
of 80
pro vyhledávání: '"Nick Ross"'
Publikováno v:
Sushruta Journal of Health Policy & Opinion. 15:1-8
Workplace bullying, undermining and microaggressions are a reality for many, and although the prevalence may vary, there is no environment that is free of such hostile interactions. The healthcare workforce is focussed on empathy, kindness and caring
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::955f1b2a392aa028053f6c1be9de915e
https://doi.org/10.38192/15.1.1
https://doi.org/10.38192/15.1.1
Autor:
Nick Ross
Publikováno v:
British Journal of Psychiatry. 212:265-268
Broadcaster and journalist. FRCP (hon)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ae2224954c4896c5b3538190c6da344e
https://doi.org/10.1192/bjp.2018.64
https://doi.org/10.1192/bjp.2018.64
Autor:
Muthappan Asokan, John Alptekin, Nick Ross, Ashish Salunke, Joshua Caperton, Goutham Issac Ashok Kumar, Oliver Chyan
Publikováno v:
Microelectronics Reliability. 113:113917
Microelectronic reliability requirements are tightening to a standard of near zero ppb defects due to the evolution of self-driving cars and wearable electronics. The successful transition from gold (Au) to copper (Cu) in wire-bonding introduces corr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c5fd6e66cd096ca0662b4f87a3d5fb5f
https://doi.org/10.1016/j.microrel.2020.113917
https://doi.org/10.1016/j.microrel.2020.113917
Autor:
Nick Ross
Publikováno v:
BMJ (Clinical research ed.). 360
The following is a letter of 5 February 2018 to the chair of the General Medical Council. Dear Professor Stephenson, My last letter to you about Hadiza Bawa-Garba (9 November 2017)1 was followed by a stream of similar comments in the medical and nati
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9cefabcb8707cb8d337585dbc7aa3d4d
https://pubmed.ncbi.nlm.nih.gov/29459382
https://pubmed.ncbi.nlm.nih.gov/29459382
Publikováno v:
Supportive Care in Cancer. 28:963-964
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c30a425d2175ede5c7089aa30c3c7f67
https://doi.org/10.1007/s00520-019-05010-w
https://doi.org/10.1007/s00520-019-05010-w
Autor:
L. Nguyen, S. Berhe, Nick Ross, S. O. Connor, A. Lambert, M. Chowdhury, Oliver Chyan, Muthappan Asokan
Publikováno v:
2017 IEEE 67th Electronic Components and Technology Conference (ECTC).
Heavy corrosion on Aluminum (Al) bond pad, with a "mud-crack" appearance, in a Copper (Cu) wire-bonded assembly can be a critical failure mode, especially under harsh conditions such as in automotive environments. Such corrosion can be associated wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3686ea8245f02ee11ff64105189d2bc4
https://doi.org/10.1109/ectc.2017.43
https://doi.org/10.1109/ectc.2017.43
Publikováno v:
ECS Meeting Abstracts. :977-977
The explosion of microelectronics use in automobiles has made the microelectronic corrosion control more critical over the past decade. Wire bonded devices form an integral part of the microelectronic systems used in automobiles. With the reliability
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::780c2abed0dc38a67e5c9b36c123f0b2
https://doi.org/10.1149/ma2019-01/16/977
https://doi.org/10.1149/ma2019-01/16/977
Publikováno v:
MRS Proceedings. 1536:127-132
In this study, we employed Multiple Internal Reflection Infrared Spectroscopy (MIR-IR) to characterize chemical bonding structures of boron doped hydrogenated amorphous silicon (a-Si:H(B)). This technique has been shown to provide over a hundred fold
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::647bce24cea316aa22061b6a98fe141f
https://doi.org/10.1557/opl.2013.752
https://doi.org/10.1557/opl.2013.752
Publikováno v:
ECS Transactions. 41:315-322
The introduction of porous ultralow-k (ULK) dielectrics into Cu metal interconnect continues to pose major BEP integration difficulties beyond 32 nm. As stated in the2009 ITRS Roadmap, “Etching and ashing processes are among the worst processes for
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6396e93760a54e757f2c60027c5eced8
https://doi.org/10.1149/1.3630859
https://doi.org/10.1149/1.3630859
Publikováno v:
JAMA Internal Medicine. 178:1142
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a2e7c3dd87ebdf95ce43c027c1c1831
https://doi.org/10.1001/jamainternmed.2018.3550
https://doi.org/10.1001/jamainternmed.2018.3550