Zobrazeno 1 - 10
of 132
pro vyhledávání: '"Nicholas W. M. Ritchie"'
Autor:
Nicholas W. M. Ritchie
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.
NeXL is a collection of Julia language packages (libraries) for X-ray microanalysis data processing. NeXLCore provides basic atomic and X-ray physics data and models including support for microanalysis-related data types for materials and k-ratios. N
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::2aea9e874f95b134735f6e58f7aac0ef
https://pubmed.ncbi.nlm.nih.gov/35232526
https://pubmed.ncbi.nlm.nih.gov/35232526
Registering Particle Data Sets Using a Rotation and Translation Invariant Nearest-Neighbor Algorithm
Publikováno v:
Microscopy and Microanalysis. 29:512-519
It can be useful to register (or align) two sets of particle data measured from the same physical sample. However, if the two data sets were collected at different translational or rotational offsets, finding the optimal registration can be a challen
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::8c58d622662bd5d800e3ff8f1160ac22
https://doi.org/10.1093/micmic/ozac033
https://doi.org/10.1093/micmic/ozac033
Autor:
Charles Tarrio, Thomas B. Lucatorto, Robert F. Berg, Dale E. Newbury, Nicholas W. M. Ritchie, Andrew R. Jones, Frank Eparvier
Publikováno v:
Solar Physics. 298
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d9f311bdee47ed0e10a0188f6d56fee8
https://doi.org/10.1007/s11207-023-02112-x
https://doi.org/10.1007/s11207-023-02112-x
Autor:
Nicholas W M Ritchie
Publikováno v:
Microscopy and Microanalysis. 28:496-498
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::331aa83b8da171aacc7cd54802cc6756
https://doi.org/10.1017/s143192762200263x
https://doi.org/10.1017/s143192762200263x
Publikováno v:
Microsc Microanal
Quantification of electron-exited X-ray spectra following the standards-based “k-ratio” (unknown/standard intensity) protocol with corrections for “matrix effects” (electron energy loss and backscattering, X-ray absorption, and secondary X-ra
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7915c0071449856a9d9b976cfc7c8335
https://doi.org/10.1017/s1431927621012617
https://doi.org/10.1017/s1431927621012617
Autor:
Dale E Newbury, Nicholas W M Ritchie
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada.
Electron-excited X-ray microanalysis with energy-dispersive spectrometry (EDS) proceeds through the application of the software that extracts characteristic X-ray intensities and performs corrections for the physics of electron and X-ray interactions
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f3878c8152f19699fefb970a390f6ade
https://pubmed.ncbi.nlm.nih.gov/36052846
https://pubmed.ncbi.nlm.nih.gov/36052846
Autor:
Nicholas W. M. Ritchie
Publikováno v:
Microscopy and Microanalysis. 27:74-89
This, the second in a series of articles present a new framework for considering the computation of uncertainty in electron excited X-ray microanalysis measurements, will discuss matrix correction. The framework presented in the first article will be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::73aa90adde74dbbaf1b42ab760935798
https://doi.org/10.1017/s1431927620024691
https://doi.org/10.1017/s1431927620024691
Publikováno v:
Microscopy and Microanalysis. 27:2056-2058
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::255580206573e9a2f0fc03ae8f12c47c
https://doi.org/10.1017/s1431927621007455
https://doi.org/10.1017/s1431927621007455
Autor:
Nicholas W. M. Ritchie
Publikováno v:
Microscopy and Microanalysis. 26:469-483
This is the first in a series of articles which present a new framework for computing the standard uncertainty in electron excited X-ray microanalysis measurements. This article will discuss the framework and apply it to a handful of simple, but usef
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::fe0e0f53aafc736a269e3a5a2617d425
https://doi.org/10.1017/s1431927620001555
https://doi.org/10.1017/s1431927620001555
Publikováno v:
MRS Adv
NIST DTSA-II is a free, open access, and fully-documented comprehensive software platform for electron-excited X-ray microanalysis with energy dispersive spectrometry (EDS), including tools for quantification, measurement optimization, and spectrum s
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9bc9eff1e6bd60facf4a6c10096eb61a
https://europepmc.org/articles/PMC9813930/
https://europepmc.org/articles/PMC9813930/
