Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Nicholai L Esperance"'
Autor:
Bharath Nandakumar, Madhur Maheshwari, Sameer Chillarige, Robert Redburn, Jeff Zimmerman, Nicholai L Esperance, Edward Dziarcak
Publikováno v:
2022 IEEE International Test Conference (ITC).
Autor:
Bharath Nandakumar, Robert C. Redburn, Nicholai L' Esperance, Sameer Chillarige, Atul Chabbra, Anil K. Malik
Publikováno v:
ITC
The main goal of existing scan chain diagnosis approaches is to identify a point (or range of points) in the scan chain(s) at which values are directly corrupted due to a defect. A common assumption made in these techniques is the defect causing fail
Autor:
Atul Chabbra, Anil K. Malik, Jeff Zimmerman, Robert C. Redburn, Nicholai L' Esperance, Adisun Wheelock, Sameer Chillarige, Bharath Nandakumar, Martin Amodeo
Publikováno v:
2020 IEEE International Test Conference India.
Numerous areas of VLSI Design and Automation including test and diagnosis have already started benefiting from machine learning based approaches. In this paper, we focus on application of machine learning techniques in the context of Volume Diagnosis