Zobrazeno 1 - 10
of 722
pro vyhledávání: '"Ni, Pei"'
Autor:
Zhang, Xin, Ni, Pei, Wang, Guo-Guang, Ding, Jun-Ying, Pan, Jun-Yi, Cui, Jian-Ming, Han, Liang, Jiang, Yao-Hui, Li, Li, Chen, Li-Li
Publikováno v:
In Ore Geology Reviews May 2024 168
Autor:
Zhao, Lian-Qing, Ni, Pei, Li, Wen-Sheng, Albanese, Stefano, Zhang, Kai-Han, Wang, Guo-Guang, Pan, Jun-Yi
Publikováno v:
In Journal of Geochemical Exploration April 2024 259
Publikováno v:
In Journal of Geochemical Exploration April 2024 259
Autor:
Gao, Yan, Ni, Pei, Pan, Jun-Yi, Chen, Hui, Li, Wen-Sheng, Han, Liang, Cui, Jian-Ming, Fan, Ming-Sen, Ding, Jun-Ying
Publikováno v:
In Ore Geology Reviews January 2024 164
Autor:
Liu, Yu-Pei, Ni, Pei, Pan, Jun-Yi, Cui, Jian-Ming, Li, Wen-Sheng, Han, Liang, Gao, Yan, Ding, Jun-Ying, Dai, Bao-Zhang
Publikováno v:
In Ore Geology Reviews December 2023 163
Autor:
Zhao, Zi-Hao, Ni, Pei, Fan, Ming-Sen, Ding, Jun-Ying, Pan, Jun-Yi, Chen, Yong-Kang, Liu, Zheng, Zhang, Zhen
Publikováno v:
In Ore Geology Reviews December 2023 163
Publikováno v:
In Journal of Genetics and Genomics November 2023 50(11):815-834
Autor:
Ni, Pei-Rong, 倪培榮
106
The reliability analysis of MEMS (Micro Electro Mechanical System) components is an important issue when developing the novel MEMS sensor. In this study, finite element models are used to analyze the reliability of CMOS-MEMS capacitive micro
The reliability analysis of MEMS (Micro Electro Mechanical System) components is an important issue when developing the novel MEMS sensor. In this study, finite element models are used to analyze the reliability of CMOS-MEMS capacitive micro
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/366bv8
Autor:
Huang, Wen-Qing, Ni, Pei, Pan, Jun-Yi, Zhou, Jun-Gui, Shui, Ting, Chen, Hui, Fan, Ming-Sen, Cui, Jian-Ming, Meng, Fan-Wei, Ding, Jun-Ying
Publikováno v:
In Ore Geology Reviews October 2023 161
Publikováno v:
In Ore Geology Reviews September 2023 160