Zobrazeno 1 - 10
of 91
pro vyhledávání: '"Nguyễn Minh Phượng"'
In the Emotion Recognition in Conversation task, recent investigations have utilized attention mechanisms exploring relationships among utterances from intra- and inter-speakers for modeling emotional interaction between them. However, attributes suc
Externí odkaz:
http://arxiv.org/abs/2407.04279
Publikováno v:
In Neurocomputing 14 February 2025 618
Autor:
Nguyen, Ha-Thanh, Nguyen, Minh-Phuong, Vuong, Thi-Hai-Yen, Bui, Minh-Quan, Nguyen, Minh-Chau, Dang, Tran-Binh, Tran, Vu, Nguyen, Le-Minh, Satoh, Ken
In this paper, we introduce our approaches using Transformer-based models for different problems of the COLIEE 2021 automatic legal text processing competition. Automated processing of legal documents is a challenging task because of the characterist
Externí odkaz:
http://arxiv.org/abs/2202.06397
Autor:
Chu, Mengmeng, Khokhar, Muhammad Quddamah, Han, Seungyong, Wang, Fucheng, Nguyen, Minh Phuong, Dao, Vinh-Ai, Pham, Duy Phong, Yi, Junsin
Publikováno v:
In Optical Materials August 2024 154
Autor:
Nguyen, Ha-Thanh, Tran, Vu, Dang, Tran-Binh, Bui, Minh-Quan, Nguyen, Minh-Phuong, Nguyen, Le-Minh
Attention is all we need as long as we have enough data. Even so, it is sometimes not easy to determine how much data is enough while the models are becoming larger and larger. In this paper, we propose HYDRA heads, lightweight pretrained linguistic
Externí odkaz:
http://arxiv.org/abs/2109.05349
Autor:
Huynh, Dinh Chien, Nguyen, Minh Phuong, Ngo, Dinh Trung, Nguyen, Xuan Hung, Nguyen, Dac Tu, Mai, Thi Hien, Le, Thi Huyen, Hoang, Mai Duy, Le, Khac Linh, Nguyen, Khoi Quan, Nguyen, Viet Hoang, Kelley, Keith W.
Publikováno v:
In Heliyon 15 May 2024 10(9)
Autor:
Jeong, Yeojin, Nguyen, Minh Phuong, Song, Jang-Kun, Kim, Yong-Sang, Chung, Yung-Bin, Jeon, Woo-Seok, Jo, Jungyun, Kim, Youngkuk, Pham, Duy Phong, Yi, Junsin
Publikováno v:
In Optical Materials February 2024 148
Autor:
Cho, Jaewoong, Choi, Jiwon, Nguyen, Minh Phuong, Trinh, Thanh Thuy, Song, Jang-Kun, Kim, Yong-Sang, Pham, Duy Phong, Yi, Junsin
Publikováno v:
In Microelectronics Reliability February 2024 153
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