Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Ngeah Theng Chua"'
Autor:
Tanaka, Hidenori, Chentir, Mohamed-Tahar, Yamada, Tomoaki, Yasui, Shintaro, Ehara, Yoshitaka, Yamato, Keisuke, Kashiwagi, Yuta, Ngeah Theng, Chua, Wang, Junling, Okamura, Soichiro, Uchida, Hiroshi, Iijima, Takashi, Wada, Satoshi, Funakubo, Hiroshi
Publikováno v:
Journal of Applied Physics; Apr2012, Vol. 111 Issue 8, p084108, 5p, 11 Graphs
Autor:
Ong Hock Guan, Ngeah Theng Chua, Lang Chen, Xi Zou, Gaofeng Chen, Lu You, Weigang Chen, Junling Wang
Publikováno v:
Thin Solid Films. 518:e169-e173
The polarization relaxation phenomenon in a 40-nm-thick epitaxial BiFeO 3 thin film grown on a (001) SrTiO 3 substrate with SrRuO 3 bottom electrode, was studied in nanoscale using dual-frequency resonance-tracking piezoresponse force microscopy. The
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::70f75429e01f7d46637e49de65979931
https://doi.org/10.1016/j.tsf.2010.03.089
https://doi.org/10.1016/j.tsf.2010.03.089
Autor:
Lindholm, Dag, Mortensen, Dag, Fjær, Hallvard, Shao Jiang Yan, Song, Adolphus, Aik Lee Tan, Ngeah Theng Chua
Publikováno v:
AIP Conference Proceedings; 2018, Vol. 1999 Issue 1, p1-9, 9p
Autor:
Ngeah Theng. Chua
Lead-based ferro/piezoelectric materials, such as Pb(Zr0.52Ti0.48)O3, are widely used because of their excellent ferroelectric and piezoelectric properties near the morphotropic phase boundary. However, due to the environmental concerns associated wi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0dd9788bfcdd74a9486d6c9b645127aa
https://hdl.handle.net/10356/38589
https://hdl.handle.net/10356/38589
To investigate the properties of (K,Na)NbO 3 -based lead-free piezoelectric films at the morphotropic phase boundary composition, we fabricated epitaxial [(K 0.5 Na 0.5 ) 0.97 Li 0.03 ] (Nb 0.8 Ta 0.2 )O 3 films on (001), (110) and (111)-oriented sin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::009549830c30723f42ff81c36c7db353
https://hdl.handle.net/10356/94372
https://hdl.handle.net/10356/94372
Publikováno v:
Physical Review B. 80
The growth window of multiferroic ${\text{BiFeO}}_{3}$ thin films is very small. Both temperature and oxygen pressure will affect the film quality and phase purity significantly. We demonstrate here that even within the window where phase pure ${\tex
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::24892db1d670ae8d4f93b3265b30f157
https://doi.org/10.1103/physrevb.80.024105
https://doi.org/10.1103/physrevb.80.024105