Low-frequency noise of 90 nm nFETs: hot-carrier degradation and deuterium effect.

Autor: Erturk, M., Anna, R., Xia, T., Clark, W.F., Nexvton, K.M., Pekarik, J.J., Lamothe, C.J., Lacroix, M.R.

Publikováno v: 2004 Digest of Papers. 2004 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems; 2004, p127-130, 4p