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pro vyhledávání: '"Nethala N"'
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Akademický článek
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K zobrazení výsledku je třeba se přihlásit.
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Autor:
Karmakar S; Electrical Engineering, Ingram School of Engineering, Texas State University, San Marcos, Texas 78666, United States., Shiam IF; Electrical Engineering, Ingram School of Engineering, Texas State University, San Marcos, Texas 78666, United States., Manikanthababu N; Electrical Engineering, Ingram School of Engineering, Texas State University, San Marcos, Texas 78666, United States., Emu IH; Electrical Engineering, Ingram School of Engineering, Texas State University, San Marcos, Texas 78666, United States., Droopad R; Electrical Engineering, Ingram School of Engineering, Texas State University, San Marcos, Texas 78666, United States.; Materials Science, Engineering & Commercialization Program, Texas State University, San Marcos, Texas 78666, United States., Haque A; Electrical Engineering, Ingram School of Engineering, Texas State University, San Marcos, Texas 78666, United States.; Materials Science, Engineering & Commercialization Program, Texas State University, San Marcos, Texas 78666, United States.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2024 Sep 11; Vol. 16 (36), pp. 48488-48501. Date of Electronic Publication: 2024 Aug 31.
Autor:
Sheoran H; Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi110016, India., Fang S; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui230026, People's Republic of China., Liang F; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui230026, People's Republic of China., Huang Z; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui230026, People's Republic of China., Kaushik S; Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi110016, India., Manikanthababu N; Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi110016, India., Zhao X; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui230026, People's Republic of China., Sun H; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui230026, People's Republic of China., Singh R; Department of Physics, Indian Institute of Technology Delhi, Hauz Khas, New Delhi110016, India.; Department of Electrical Engineering, Indian Institute of Technology Delhi, New Delhi110016, India., Long S; School of Microelectronics, University of Science and Technology of China, Hefei, Anhui230026, People's Republic of China.
Publikováno v:
ACS applied materials & interfaces [ACS Appl Mater Interfaces] 2022 Nov 23; Vol. 14 (46), pp. 52096-52107. Date of Electronic Publication: 2022 Nov 08.