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pro vyhledávání: '"Nehanth Kola"'
Autor:
Yerramreddy Lakshmi Pranathi, Shahana Bano, Chintakrindi Geaya Sri, Nehanth Kola, Tinnavalli Deepika
Publikováno v:
2021 International Conference on Intelligent Technologies (CONIT).
The proposed model is implemented in deep learning based on counterfeit feature extraction and Error Level Analysis (ELA) techniques. Error level analysis is used to improve the efficiency of distinguishing copy-move images produced by Deep Fake from
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1f00a0b23dcb447e8e59fb197a1f07d5
https://doi.org/10.1109/conit51480.2021.9498357
https://doi.org/10.1109/conit51480.2021.9498357
