Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Neha Anchal"'
Autor:
Bijay Kumar Sahoo, Neha Anchal
Publikováno v:
Materials Today: Proceedings. 28:311-313
In this work, effect of strain on efficiency droop of InGaN/GaN blue LEDs is investigated. This blue LEDs faces significant efficiency droop issue. The causes of efficiency droop are Shockley Read Hall recombination (SRH), Auger recombination (AR), c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::dd341d7f41202e5ffa882ff465f93576
https://doi.org/10.1016/j.matpr.2020.02.155
https://doi.org/10.1016/j.matpr.2020.02.155
Publikováno v:
AIP Conference Proceedings.
InxGa1-x N/GaN blue LEDs faces significant efficiency droop issue. The causes of efficiency droop are Shockley Read Hall recombination (SRH), Auger recombination (AR), carrier delocalization and electron leakage. The SRH, Auger and electron leakage a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4077f080654366faed139a068dd7ff4
https://doi.org/10.1063/5.0001260
https://doi.org/10.1063/5.0001260
Autor:
Neha Anchal, Bijay Kumar Sahoo
Publikováno v:
IOP Conference Series: Materials Science and Engineering. 798:012017
InxGa1-x N/GaN blue LEDs faces significant efficiency droop issue. The causes of efficiency droop are Shockley Read Hall recombination (SRH), Auger recombination (AR), carrier delocalization (CD) and electron leakage (EL). The SRH, Auger and electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d6f6908f1e467bc8614483ddda31e0b0
https://doi.org/10.1088/1757-899x/798/1/012017
https://doi.org/10.1088/1757-899x/798/1/012017