Zobrazeno 1 - 10
of 22
pro vyhledávání: '"Ndukaife JC"'
Autor:
Hong C; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA.; Vanderbilt Institution of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, USA., Hong I; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA.; Vanderbilt Institution of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, USA., Jiang Y; Department of Electrical and Computer Engineering, University of Maryland College Park, MD, USA.; Institute for Research in Electronics and Applied Physics (IREAP), University of Maryland College Park, MD, USA., Ndukaife JC; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA.; Vanderbilt Institution of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, USA.; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN, USA.
Publikováno v:
Advanced optical materials [Adv Opt Mater] 2024 Apr 24; Vol. 12 (12). Date of Electronic Publication: 2024 Feb 08.
Autor:
Zhu G; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, 37235, USA.; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, 37235, USA., Yang S; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, 37235, USA.; Interdisciplinary Materials Science, Vanderbilt University, Nashville, TN, 37235, USA., Ndukaife JC; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, 37235, USA.; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, 37235, USA.; Interdisciplinary Materials Science, Vanderbilt University, Nashville, TN, 37235, USA.
Publikováno v:
Nanophotonics (Berlin, Germany) [Nanophotonics] 2024 Mar 08; Vol. 13 (9), pp. 1561-1568. Date of Electronic Publication: 2024 Mar 08 (Print Publication: 2024).
Publikováno v:
Optics express [Opt Express] 2024 Feb 12; Vol. 32 (4), pp. 4769-4777.
Autor:
Yang S; Institute of Physics, Chinese Academy of Sciences/Beijing National Laboratory for Condensed Matter Physics, Beijing 100190, China.; Interdisciplinary Materials Science Program, Vanderbilt University, Nashville, Tennessee 37240, USA., Hong C; Department of Chemistry and Department of Materials Science and Engineering, Northwestern University, Evanston, Illinois 60208, USA.; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, USA., Zhu G; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, USA., Anyika T; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, USA., Hong I; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, USA., Ndukaife JC; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, USA.; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37235, USA.; Interdisciplinary Materials Science Program, Vanderbilt University, Nashville, Tennessee 37240, USA.
Publikováno v:
Advances in physics: X [Adv Phys X] 2024; Vol. 9 (1). Date of Electronic Publication: 2024 Oct 22.
Autor:
Anyika T; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Vanderbilt Institute of Nanoscale Science and Engineering, Nashville, Tennessee 37235, United States., Hong I; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Vanderbilt Institute of Nanoscale Science and Engineering, Nashville, Tennessee 37235, United States., Ndukaife JC; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Vanderbilt Institute of Nanoscale Science and Engineering, Nashville, Tennessee 37235, United States.; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.
Publikováno v:
Nano letters [Nano Lett] 2023 Dec 27; Vol. 23 (24), pp. 11416-11423. Date of Electronic Publication: 2023 Nov 21.
Autor:
Hong I; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States., Hong C; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States., Tutanov OS; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States., Massick C; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States., Castleberry M; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States., Zhang Q; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States., Jeppesen DK; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States., Higginbotham JN; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States., Franklin JL; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Department of Cell and Developmental Biology, Vanderbilt University, Nashville, Tennessee 37232, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States., Vickers K; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States., Coffey RJ; Department of Medicine, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States.; Department of Cell and Developmental Biology, Vanderbilt University, Nashville, Tennessee 37232, United States.; Epithelial Biology Center, Vanderbilt University Medical Center, Nashville, Tennessee 37232, United States., Ndukaife JC; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Department of Mechanical Engineering, Vanderbilt University, Nashville, Tennessee 37235, United States.; Center for Extracellular Vesicles Research, Vanderbilt University, Nashville, Tennessee 37235, United States.
Publikováno v:
Nano letters [Nano Lett] 2023 Aug 23; Vol. 23 (16), pp. 7500-7507. Date of Electronic Publication: 2023 Aug 08.
Autor:
Hong C; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA.; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, USA., Ndukaife JC; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu.; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu.; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu.
Publikováno v:
Nature communications [Nat Commun] 2023 Aug 09; Vol. 14 (1), pp. 4801. Date of Electronic Publication: 2023 Aug 09.
Autor:
Yang S; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA.; Interdisciplinary Materials Science, Vanderbilt University, Nashville, TN, USA., Ndukaife JC; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu.; Interdisciplinary Materials Science, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu.; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu.
Publikováno v:
Light, science & applications [Light Sci Appl] 2023 Jul 28; Vol. 12 (1), pp. 188. Date of Electronic Publication: 2023 Jul 28.
Autor:
Anyika T; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu., Hong C; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu., Ndukaife JC; Department of Electrical and Computer Engineering, Vanderbilt University, Nashville, TN, USA. justus.ndukaife@vanderbilt.edu.; Interdisciplinary Materials Science and Engineering, Vanderbilt University, Nashville, TN, USA.; Department of Mechanical Engineering, Vanderbilt University, Nashville, TN, USA.
Publikováno v:
Nanoscale [Nanoscale] 2023 Jun 08; Vol. 15 (22), pp. 9710-9717. Date of Electronic Publication: 2023 Jun 08.
Autor:
Hong C; Electrical and Computer Engineering Department, Vanderbilt University Nashville TN 37212 USA justus.ndukaife@vanderbilt.edu.; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University Nashville TN 37212 USA., Yang S; Electrical and Computer Engineering Department, Vanderbilt University Nashville TN 37212 USA justus.ndukaife@vanderbilt.edu.; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University Nashville TN 37212 USA., Ndukaife JC; Electrical and Computer Engineering Department, Vanderbilt University Nashville TN 37212 USA justus.ndukaife@vanderbilt.edu.; Vanderbilt Institute of Nanoscale Science and Engineering, Vanderbilt University Nashville TN 37212 USA.; Interdisciplinary Material Science, Vanderbilt University Nashville TN 37212 USA.
Publikováno v:
Nanoscale advances [Nanoscale Adv] 2023 May 04; Vol. 5 (11), pp. 2973-2978. Date of Electronic Publication: 2023 May 04 (Print Publication: 2023).