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Publikováno v:
2015 International Conference on Electrical Engineering and Information Communication Technology (ICEEICT).
A novel integrated fault diagnosis method of 8 bit Digital to Analog Converter (DAC) circuit is presented in our paper. The circuit is based on the one presented in the IEEE 1997 International Test Conference (ITC'97). The gain waveforms of faulty an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eeb949fb8fb6843b97290136cee9c895
https://doi.org/10.1109/iceeict.2015.7307436
https://doi.org/10.1109/iceeict.2015.7307436
