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Autor:
Despont, L., Naumović, Dusanka, Clerc, F., Koitzsch, C., Garnier, M.G., Abajo, F.J. Garcia de, Hove, M.A. Van
Multiple scattering theory based on a cluster model is used to simulate full-hemispherical X-ray photoelectron diffraction measurements in order to verify how state of the art multiple scattering simulations are able to reproduce the experiment. This
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od_______805::ca4b9e20fb648e48086a98603e3c051f
http://doc.rero.ch/record/7873/files/naumovic_xrp.pdf
http://doc.rero.ch/record/7873/files/naumovic_xrp.pdf
