Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Natwar Bhootda"'
Publikováno v:
Materials Today: Proceedings. 80:2071-2075
As the technology is scaled-down and with a decrease in oxide thickness, the effect of NBTI is a major reliability issue in semiconductor industries. NBTI is an aging phenomenon in which the PMOS transistor degraded over time. Deviation in the thresh
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::226a97283255030f7b9b7fa61ee086d2
https://doi.org/10.1016/j.matpr.2021.06.115
https://doi.org/10.1016/j.matpr.2021.06.115
Publikováno v:
International Journal of Numerical Modelling: Electronic Networks, Devices and Fields. 35
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7f02a6327fe5ebde5a8f618460ea6616
https://doi.org/10.1002/jnm.2953
https://doi.org/10.1002/jnm.2953