Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Natsuko Sagawa"'
Publikováno v:
The Journal of Physical Chemistry C. 113:4260-4262
We synthesized a series of n-octadecylsiloxanes having different empirical formulas, that is, R-SiO3/2 (R = C18H37), R-(CH3)SiO2/2, and R-(CH3)2SiO1/2. We found that the compound with the formula R-SiO3/2 shows the highest PL emission with a quantum
Publikováno v:
SPIE Proceedings.
Immersion scanner performance is being improved generation by generation. Faster scan speed is required to increase scanner productivity. There are, however, several papers reporting defect increase with higher scan speed 1, 2, 3 . To overcome this c
Autor:
Yuuki Ishii, Yasuhiro Iriuchijima, Natsuko Sagawa, Katsushi Nakanob, Hamid R. Khorram, Tadamasa Kawakubo, Shirou Nagaoka, Tomoharu Fujiwara
Publikováno v:
Advances in Resist Materials and Processing Technology XXVI.
Immersion lithography has gone through its first phase of introduction and acceptance as the main solution for critical layer lithography for 45nm node and beyond. In this phase, the industry has found that immersion technology has its own unique cha
Autor:
Takashi Uchino, Natsuko Sagawa
We have found that the adsorption of octadecyltrichlorosilane (OTS) monolayers on nanometer-sized silica particles yields a stable blue photoluminescence (PL) with a time scale of nanoseconds (N. Sagawa and T. Uchino, Appl. Phys. Lett. 87, 251923 (20
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9eef935f175b54dde33a9a2b5f1cc81d
https://hal.archives-ouvertes.fr/hal-00166755
https://hal.archives-ouvertes.fr/hal-00166755
Publikováno v:
Physical Review B. 73(23):233203-233203
We propose a model of the blue-light-emitting center in silicon and silica-based materials on the basis of the density functional theory calculations. It has been shown that the dehydroxylation reaction involved in the annealing process of surface hy
Autor:
Yang, Liuhua1,2 (AUTHOR) lihongzxl@126.com, Wang, Hongjiang1 (AUTHOR) pedrozhxu@gmail.com, Li, Hong1 (AUTHOR), Zhou, Xu1 (AUTHOR)
Publikováno v:
Minerals (2075-163X). Apr2019, Vol. 9 Issue 4, p240. 1p.
Cost of Ownership/Yield Enhancement of High Volume Immersion Lithography Using Topcoat-Less Resists.
Autor:
Khorram, Hamid R., Nakano, Katsushi, Sagawa, Natsuko, Fujiwara, Tomoharu, Iriuchijima, Yasuhiro, Sei, Toshihiko, Takahiro, Tomioka, Nakamura, Keichi, Shiraishi, Kenichi, Hayashi, Tsunehito
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing; Feb2012, Vol. 25 Issue 1, p63-71, 9p
Cost of Ownership/Yield Enhancement of High Volume Immersion Lithography Using Topcoat-Less Resists.
Autor:
Khorram, Hamid R., Nakano, Katsushi, Sagawa, Natsuko, Fujiwara, Tomoharu, Iriuchijima, Yasuhiro, Sei, Toshi, Takahiro, Tomioka, Nakamura, Keichi, Shiraishi, Kenichi, Hayashi, Tsunehito
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing; 05/01/2011, Vol. 24 Issue 2, p173-181, 9p
Autor:
Sagawa, Natsuko, Uchino, Takashi
Publikováno v:
Applied Physics Letters; 12/19/2005, Vol. 87 Issue 25, p251923, 3p, 1 Diagram, 3 Graphs