Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Nathaniel Hoy"'
Autor:
Nathaniel Hoy, Theodora Koulouri
Publikováno v:
2022 IEEE International Conference on Big Data (Big Data)
Autor:
Steffen Herbold, Alexander Trautsch, Benjamin Ledel, Alireza Aghamohammadi, Taher A. Ghaleb, Kuljit Kaur Chahal, Tim Bossenmaier, Bhaveet Nagaria, Philip Makedonski, Matin Nili Ahmadabadi, Kristof Szabados, Helge Spieker, Matej Madeja, Nathaniel Hoy, Valentina Lenarduzzi, Shangwen Wang, Gema Rodríguez-Pérez, Ricardo Colomo-Palacios, Roberto Verdecchia, Paramvir Singh, Yihao Qin, Debasish Chakroborti, Willard Davis, Vijay Walunj, Hongjun Wu, Diego Marcilio, Omar Alam, Abdullah Aldaeej, Idan Amit, Burak Turhan, Simon Eismann, Anna-Katharina Wickert, Ivano Malavolta, Matúš Sulír, Fatemeh Fard, Austin Z. Henley, Stratos Kourtzanidis, Eray Tuzun, Christoph Treude, Simin Maleki Shamasbi, Ivan Pashchenko, Marvin Wyrich, James Davis, Alexander Serebrenik, Ella Albrecht, Ethem Utku Aktas, Daniel Strüber, Johannes Erbel
Publikováno v:
Emperical Software Engineering, 27, 6, pp. 1-55
Empirical Software Engineering, 27:125, 1-49. Springer Netherlands
Herbold, S, Trautsch, A, Ledel, B, Aghamohammadi, A, Ghaleb, T A, Chahal, K K, Bossenmaier, T, Nagaria, B, Makedonski, P, Ahmadabadi, M N, Szabados, K, Spieker, H, Madeja, M, Hoy, N, Lenarduzzi, V, Wang, S, Rodríguez-Pérez, G, Colomo-Palacios, R, Verdecchia, R, Singh, P, Qin, Y, Chakroborti, D, Davis, W, Walunj, V, Wu, H, Marcilio, D, Alam, O, Aldaeej, A, Amit, I, Turhan, B, Eismann, S, Wickert, A K, Malavolta, I, Sulír, M, Fard, F, Henley, A Z, Kourtzanidis, S, Tuzun, E, Treude, C, Shamasbi, S M, Pashchenko, I, Wyrich, M, Davis, J, Serebrenik, A, Albrecht, E, Aktas, E U, Strüber, D & Erbel, J 2022, ' A fine-grained data set and analysis of tangling in bug fixing commits ', Empirical Software Engineering, vol. 27, 125, pp. 1-49 . https://doi.org/10.1007/s10664-021-10083-5
Empirical Software Engineering, 27(6):125. Springer
Empirical Software Engineering, 27 (6), Art.-Nr.: 125
Emperical Software Engineering, 27, 1-55
Empirical Software Engineering, 27:125, 1-49. Springer Netherlands
Herbold, S, Trautsch, A, Ledel, B, Aghamohammadi, A, Ghaleb, T A, Chahal, K K, Bossenmaier, T, Nagaria, B, Makedonski, P, Ahmadabadi, M N, Szabados, K, Spieker, H, Madeja, M, Hoy, N, Lenarduzzi, V, Wang, S, Rodríguez-Pérez, G, Colomo-Palacios, R, Verdecchia, R, Singh, P, Qin, Y, Chakroborti, D, Davis, W, Walunj, V, Wu, H, Marcilio, D, Alam, O, Aldaeej, A, Amit, I, Turhan, B, Eismann, S, Wickert, A K, Malavolta, I, Sulír, M, Fard, F, Henley, A Z, Kourtzanidis, S, Tuzun, E, Treude, C, Shamasbi, S M, Pashchenko, I, Wyrich, M, Davis, J, Serebrenik, A, Albrecht, E, Aktas, E U, Strüber, D & Erbel, J 2022, ' A fine-grained data set and analysis of tangling in bug fixing commits ', Empirical Software Engineering, vol. 27, 125, pp. 1-49 . https://doi.org/10.1007/s10664-021-10083-5
Empirical Software Engineering, 27(6):125. Springer
Empirical Software Engineering, 27 (6), Art.-Nr.: 125
Emperical Software Engineering, 27, 1-55
Context: Tangled commits are changes to software that address multiple concerns at once. For researchers interested in bugs, tangled commits mean that they actually study not only bugs, but also other concerns irrelevant for the study of bugs. Object
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d689f808bf1a79c62d0194a850a52737
https://repository.ubn.ru.nl/handle/2066/251944
https://repository.ubn.ru.nl/handle/2066/251944