Výsledky vyhledávání - "Nathan Havercroft"

Recent Innovations and Perspectives in TOF-SIMS

Autor: Felix Kollmer, Alexander Pirkl, Henrik Arlinghaus, Rudolf Möllers, Nathan Havercroft, Ewald Niehuis

Publikováno v: Microscopy and Microanalysis. 28:942-943

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::2453d1378ab38b96572c9f49d8dd492c
https://doi.org/10.1017/s1431927622004123

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Recent Advances in 2D and 3D TOF SIMS Analysis of Organic and Inorganic Surfaces

Autor: Felix Kollmer, Henrik Arlinghaus, Ewald Niehuis, Sven Kayser, Alexander Pirkl, Nathan Havercroft, Rudolf Moellers

Publikováno v: Microscopy and Microanalysis. 26:76-77

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4a46f05bd02288050b6ec3077d09cae5
https://doi.org/10.1017/s143192762001329x

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TOF-SIMS Analysis with High Lateral and High Mass Resolution in Parallel

Autor: Anja Henss, Ewald Niehuis, Wolfgang Paul, Nathan Havercroft, Felix Kollmer, Rudolf Moellers, Henrik Arlinghaus

Publikováno v: Microscopy and Microanalysis. 24:1026-1027

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::a38ac7ea82e5f9b680d60adf4f7cd056
https://doi.org/10.1017/s1431927618005627

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SIMS Imaging and 3D Microanalysis of Organic Structures

Autor: Ewald Niehuis, D. Rading, Felix Kollmer, Nathan Havercroft

Publikováno v: Microscopy and Microanalysis. 16:412-413

Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=doi_________::4ce89eeff1de76e3ee614a22328129d9
https://doi.org/10.1017/s1431927610059209

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