Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Nathan A. Diachun"'
Publikováno v:
The Journal of Physical Chemistry B. 102:7112-7119
Poly(styrene-co-2-vinylnaphthalene) with a 1.25% fraction of naphthyl fluorophores is studied in two polymeric hosts, polystyrene and poly(vinyl methyl ether). In the polystyrene host, measurement of the electronic excitation transport-induced fluore
Autor:
Michael D. Fayer, Stuart A. Rice, Nathan A. Diachun, Deborah M. Hussey, T. L. Morkved, Heinrich M. Jaeger, Andrew H. Marcus
Publikováno v:
Molecular Crystals and Liquid Crystals Science and Technology. Section A. Molecular Crystals and Liquid Crystals. 283:31-35
The morphology of chromophore rich nanometer scale domains in binary homopolymer blends is studied, both in bulk systems and in ultra thin films. For each situation, a different experimental technique is applied. Electronic excitation transport (EET)
Publikováno v:
The Journal of Chemical Physics. 103:8189-8200
The morphology of nanodomain structures in binary polymer blends of a random copolymer and a homopolymer is determined using electronic excitation transport (EET) studies. The experimental system employed is a copolymer, 6.5% atactic poly(methyl meth
Publikováno v:
Journal of the American Chemical Society. 116:1027-1032
The temperature dependent dynamics of polydimethylsiloxane (PDMS) melts are investigated by measuring orientational relaxation of a dissolved probe molecule, 2-naphthyltriethoxysilane (NTES) using time resolved fluorescence depolarization. The temper
Publikováno v:
Macromolecules. 26:3041-3048
Electronic excitation transport among interacting polymer molecules lightly tagged with chromophore substituents is examined as a function of tagged polymer concentration in the polymeric solid. The technique of time-correlated single photon counting
Autor:
Robert John Socha, Roger F. Caldwell, Nathan A. Diachun, J. Fung Chen, Thomas Laidig, Mircea Dusa, Kurt E. Wampler, Douglas Van Den Broeke, Kent H. Nakagawa
Publikováno v:
SPIE Proceedings.
Recent observations indicate that CD control for the 0.18 micrometers process generation using KrF exposure could be sensitive to borderline detectable defect sizes on a 4X reticle. It is of interest to determine if these 'sub- killer' defect sizes c
Autor:
J. Fung Chen, Nathan A. Diachun, Kent H. Nakagawa, Robert J. Socha, Mircea V. Dusa, Thomas L. Laidig, Kurt E. Wampler, Roger F. Caldwell, Douglas J. Van Den Broeke
Publikováno v:
SPIE Proceedings.
Autor:
Nathan A. Diachun, Syed A. Rizvi
Publikováno v:
SPIE Proceedings.
The AIMS Tool, manufactured by the Zeiss of Jena, Germany, is a unique combination of sophisticated optics and ingenious software designed to simulate the image of mask pattern as it would be created by a stepper on its wafer plane. This paper review
Publikováno v:
SPIE Proceedings.
Picosecond fluorescence depolarization measurements of electronic excitation transfer (EET) are used to probe the structures and dynamics of polymer blends. Fluorescent chromophores are covalently incorporated into one of the polymers in the blend, a
Publikováno v:
The Journal of Physical Chemistry. 97:972-972