Zobrazeno 1 - 10
of 56
pro vyhledávání: '"Nathalie Bouet"'
Autor:
Xi Yang, Liguo Wang, Victor Smaluk, Timur Shaftan, Tianyi Wang, Nathalie Bouet, Gabriele D’Amen, Weishi Wan, Pietro Musumeci
Publikováno v:
Nanomaterials, Vol 14, Iss 22, p 1797 (2024)
The resolution of a mega-electron-volt scanning transmission electron microscope (MeV-STEM) is primarily governed by the properties of the incident electron beam and angular broadening effects that occur within thick biological samples and microchips
Externí odkaz:
https://doaj.org/article/e15dc12864ba4c8db5570071118ba51f
Autor:
Wei Xu, Weihe Xu, Nathalie Bouet, Juan Zhou, Hanfei Yan, Xiaojing Huang, Ming Lu, Maxim Zalalutdinov, Yong S. Chu, Evgeny Nazaretski
Publikováno v:
Micromachines, Vol 11, Iss 10, p 939 (2020)
We report on a developed micromachined silicon platform for the precise assembly of 2D multilayer Laue lenses (MLLs) for high-resolution X-ray microscopy. The platform is 10 × 10 mm2 and is fabricated on ~500 µm thick silicon wafers through multipl
Externí odkaz:
https://doaj.org/article/eea07d3a6ce14eb093766d8424aa08ba
Autor:
Wei Xu, Weihe Xu, Nathalie Bouet, Juan Zhou, Hanfei Yan, Xiaojing Huang, Ming Lu, Maxim Zalalutdinov, Yong S Chu, Evgeny Nazaretski
Publikováno v:
Microscopy Today. 30:28-33
This article introduces the 2D multilayer Laue lens (MLL) nanofocusing optics recently developed for high-resolution hard X-ray microscopy. The new optics utilized a micro-electro-mechanical-system (MEMS)-based template to accommodate two linear MLL
Autor:
Wei Xu, Weihe Xu, Nathalie Bouet, Juan Zhou, Hanfei Yan, Xiaojing Huang, Lei Huang, Ming Lu, Maxim Zalalutdinov, Yong S. Chu, Evgeny Nazaretski
Publikováno v:
Optics and Lasers in Engineering. 161:107331
Autor:
Xiaolong Ke, Nathalie Bouet, Vipender Singh Negi, Lei Huang, Dennis Kuhne, Chunjin Wang, Zili Zhang, Kashmira Nakhoda, Qian Kemao, Daewook Kim, Mourad Idir, Heejoo Choi, Tianyi Wang, Weslin C. Pullen, Matthew Vescovi, Yi Zhu
Publikováno v:
Optics express. 29(23)
Computer-Controlled Optical Surfacing (CCOS) has been greatly developed and widely used for precision optical fabrication in the past three decades. It relies on robust dwell time solutions to determine how long the polishing tools must dwell at cert
Autor:
Hanfei Yan, Lei Huang, Andrew M. Kiss, Wei Xu, Yang Yang, Xiaojing Huang, Yong Song S. Chu, Evgeny Nazaretski, Weihe Xu, D. S. Coburn, Nathalie Bouet, Juan Zhou, Mourad Idir
Publikováno v:
X-Ray Nanoimaging: Instruments and Methods V.
X-ray microscopy is an invaluable and powerful characterization tool applied in many scientific fields, such as materials science, biology, environmental science, and energy research. In recent years it has been driven by rapid developments of novel
Autor:
Cesar Cusatis, Elina Kasman, Flavio Cesar Vicentin, R. Conley, Edson Massayuki Kakuno, Xian-Rong Huang, Yong Q. Cai, Juan Zhou, Marcelo Goncalves Hönnicke, João Basso Marques, Nathalie Bouet
Publikováno v:
Journal of Applied Crystallography. 52:1321-1328
X-ray beams at energies tuned slightly below that of exact backscattering (extreme conditions, where X-ray back-diffraction is almost extinguished – called residual XBD) are better focused if the experiment is carried out at lower energies in order
Autor:
Ray Conley, Juan Zhou, Xiaojing Huang, Nathalie Bouet, Yong S. Chu, Hanfei Yan, Albert T. Macrander, Evgeny Nazaretski, Jörg Maser
Publikováno v:
Journal of Nanoscience and Nanotechnology. 19:575-584
Diffraction optics fabricated from multilayers offer an intriguing alternative to lithography-based zone plates due to their advantages of virtually limitless aspect ratio and extremely small feature size. However, other issues, intrinsic to thin-fil
Autor:
Ming Lu, Xiaojing Huang, Nathalie Bouet, Juan Zhou, Hanfei Yan, Evgeny Nazaretski, Yong S. Chu, Weihe Xu, M. Zalalutdinov, Wei Xu
Publikováno v:
Micromachines
Volume 11
Issue 10
Micromachines, Vol 11, Iss 939, p 939 (2020)
Volume 11
Issue 10
Micromachines, Vol 11, Iss 939, p 939 (2020)
We report on a developed micromachined silicon platform for the precise assembly of 2D multilayer Laue lenses (MLLs) for high-resolution X-ray microscopy. The platform is 10 ×
10 mm2 and is fabricated on ~500 µ
m thick silicon waf
10 mm2 and is fabricated on ~500 µ
m thick silicon waf
Autor:
Evgeny Nazaretski, Yong S. Chu, Wei Xu, Deming Shu, Nathalie Bouet, Hanfei Yan, Kenneth Lauer, Yeukuang Hwu, Xiaojing Huang, Juan Zhou
Publikováno v:
Journal of Synchrotron Radiation. 24:1113-1119
A hard X-ray scanning microscope installed at the Hard X-ray Nanoprobe beamline of the National Synchrotron Light Source II has been designed, constructed and commissioned. The microscope relies on a compact, high stiffness, low heat dissipation appr