Zobrazeno 1 - 10
of 65
pro vyhledávání: '"Natarajan, M.I."'
Autor:
Thijs, S., Natarajan, M.I., Linten, D., Jeamsaksiri, W., Daenen, T., Degraeve, R., Scholten, Andries, Decoutere, S., Groeseneken, G.
Publikováno v:
In Microelectronics Reliability 2006 46(5):702-712
Autor:
Vassilev, V., Thijs, S., Segura, P.L., Wambacq, P., Leroux, P., Groeseneken, G., Natarajan, M.I., Maes, H.E., Steyaert, M.
Publikováno v:
In Microelectronics Reliability 2005 45(2):255-268
Autor:
Natarajan, M.I., Thijs, S., Tremouilles, D., Linten, D., Collaert, N., Jurczak, M., Groeseneken, G.
Publikováno v:
2007 14th International Symposium on the Physical & Failure Analysis of Integrated Circuits; 2007, p159-164, 6p
Autor:
Linten, D., Natarajan, M.I., Thijs, S., Van Huylenbroeck, S., Xiao, S., Carchon, G., Decoutere, S., Sawada, M., Hasebe, T., Groeseneken, G.
Publikováno v:
2006 IEEE International Conference on Semiconductor Electronics; 2006, pA7-A12, 6p
Autor:
Vashchenko, V.A., Scholz, M., Jansen, Ph., Petersen, R., Natarajan, M.I., Tremouilles, D., Sawada, M., Nakaei, T., Hasebe, T., Ter Beek, M., Groeseneken, G.
Publikováno v:
2006 Electrical Overstress/Electrostatic Discharge Symposium; 2006, p39-45, 7p
Autor:
Linten, D., Thijs, S., Jeamsaksiri, W., Ramos, J., Mercha, A., Natarajan, M.I., Wambacq, P., Scholten, A.J., Decoutere, S.
Publikováno v:
2005 Digest of Technical Papers. 2005 Symposium on VLSI Circuits; 2005, p86-89, 4p
Autor:
Linten, D., Sun, X., Thijs, S., Natarajan, M.I., Mercha, A., Carchon, G., Wambacq, P., Nakaie, T., Decoutere, S.
Publikováno v:
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005; 2005, p497-500, 4p
Autor:
Jansen, P., Thijs, S., Linten, D., Natarajan, M.I., Vassilev, V., Liu, M., Concannon, A., Tremouilles, D., Nakaie, T., Sawada, M., Vashchenko, V., ter Beek, M., Hasebe, T., Decoutere, S., Groeseneken, G.
Publikováno v:
Proceedings of the IEEE 2005 Custom Integrated Circuits Conference, 2005; 2005, p489-496, 8p
Autor:
Natarajan, M.I., Thijs, S., Jansen, P., Tremouilles, D., Jeamsaksiri, W., Decoutere, S., Linten, D., Nakaie, T., Sawada, M., Hasebe, T., Groeseneken, G.
Publikováno v:
Proceedings of the 12th International Symposium on the Physical & Failure Analysis of Integrated Circuits, 2005 (IPFA 2005); 2005, p59-66, 8p
Autor:
Thijs, S., Linten, D., Natarajan, M.I., Jeamsaksiri, W., Mercha, A., Ramos, J., Sun, X., Carchon, G., Soussan, P., Nakaie, T., Sawada, M., Hasebe, T., Wambacq, P., Decoutere, S., Groeseneken, G.
Publikováno v:
2005 Electrical Overstress/Electrostatic Discharge Symposium; 2005, p1-8, 8p