Zobrazeno 1 - 7
of 7
pro vyhledávání: '"Nataliya Dorozhovets"'
Autor:
Eberhard Manske, Tino Hausotte, Wen-Yu Jywe, Nataliya Dorozhovets, Chien-Hung Liu, Jing-Chung Shen
Publikováno v:
IFAC Proceedings Volumes. 44:3533-3538
This article considers the force control of an active probe for Atomic Force Microscopy (AFM). Firstly, the structure of this active probe is described. For designing the force controller, the model of this active probe was identified. Based on the m
Autor:
Daniel Dipl.-Ing. Kapusi, Eberhard Manske, T. Machleidt, K. H. Franke, Nataliya Dorozhovets, E. Sparrer
Publikováno v:
tm - Technisches Messen. 76:274-277
This article discusses methods to measure samples up to 25×25 mm2 using the NPMM [1] as an atomic force microscope (AFM) [2]. An entire scan at full resolution (10 nm) and 10 μm/s scan speed would take about 200 years. Therefore, overview scans wit
Autor:
G. Alexander Gross, Tino Hausotte, J. Michael Köhler, Gerd Jäger, Nataliya Dorozhovets, Aniket R. Thete
Publikováno v:
Scanning. 31(1)
The nanopositioning and nanomeasuring machine was applied for the nanotopographic characterization of polymer micro spot arrays of fluorimetric chemochips. Chemochips are arrays of fluorescence dyes in a hydrogel matrix with different response behavi
Publikováno v:
Measurement Science and Technology. 22:094018
Over the past decade a trend of component miniaturization can be observed both in industry and in the laboratory, which involves an increasing demand for nanopositioning and nanomeasuring machines as well as for miniature tactile probes for measuring
Autor:
Eberhard Manske, Tino Hausotte, G. Jäger, N. Hofmann, Rostyslav Mastylo, Nataliya Dorozhovets, H.-J. Büchner
Publikováno v:
Scopus-Elsevier
The paper describes traceable nanometrology based on a nanopositioning machine with integrated nanoprobes. The operation of a high-precision long range three-dimensional nanopositioning and nanomeasuring machine (NPM-Machine) having a resolution of 0
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9e58d6281403950b89810ff6cc8bfe38
http://www.scopus.com/inward/record.url?eid=2-s2.0-84877742338&partnerID=MN8TOARS
http://www.scopus.com/inward/record.url?eid=2-s2.0-84877742338&partnerID=MN8TOARS
Publikováno v:
Measurement Science & Technology; Sep2011, Vol. 22 Issue 9, p094018-094018, 1p
Publikováno v:
Imaging & Microscopy; 2008, Vol. 10 Issue 2, p12-12, 1p