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Publikováno v:
Thin Solid Films. 270:215-219
Spectroscopic ellipsometry was used for the characterization of ion-deposited diamond-like carbon (DLC) films, including the determination of film thickness and optical properties of DLC. The measured spectra in the wavelength range from 300 to 850 n
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a6b8baf2b15f876b331d88ed34d22137
https://doi.org/10.1016/0040-6090(95)06894-5
https://doi.org/10.1016/0040-6090(95)06894-5
