Zobrazeno 1 - 10
of 14
pro vyhledávání: '"Namita Arya"'
Publikováno v:
2023 6th International Conference on Information Systems and Computer Networks (ISCON).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::497efcf24287d28e5c177069baad5cfe
https://doi.org/10.1109/iscon57294.2023.10111937
https://doi.org/10.1109/iscon57294.2023.10111937
Publikováno v:
Indian Journal of Science and Technology. 10:1-6
Objective: An electronic system developed for specific application with the integration of hardware and software is known as Embedded System. Due to complexity of hardware and software in a single system, it requires specific technique for testing be
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::064c40cec332c5a668b74d13567986dc
https://doi.org/10.17485/ijst/2017/v10i30/115526
https://doi.org/10.17485/ijst/2017/v10i30/115526
Autor:
Amit Prakash Singh, Namita Arya
Publikováno v:
International Journal of Engineering and Technology. 9:93-97
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a54d2fbf2546e8c3820daaa19cbeab5f
https://doi.org/10.21817/ijet/2017/v9i3/170903s016
https://doi.org/10.21817/ijet/2017/v9i3/170903s016
Autor:
Amit Prakash Singh, Namita Arya
This paper introduces an approach that chooses the fault detection by calculating probabilities using probability mass function (pmf) and cumulative distribution function (CDF). This work used a method for multiple stuck-at faults by producing a new
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::01519fbccd5d3704c72e85e0748b57bc
https://doi.org/10.20944/preprints201810.0199.v1
https://doi.org/10.20944/preprints201810.0199.v1
Publikováno v:
2018 7th International Conference on Reliability, Infocom Technologies and Optimization (Trends and Future Directions) (ICRITO).
In our society, the trashcans are placed at public places in the cities and it is overflowing due to tremendous growth of the waste production every day. It leads to spreading of some diseases and proliferating human ailment, to avoid such situation
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d53255b65ca0f4fba996ded70854de45
https://doi.org/10.1109/icrito.2018.8748636
https://doi.org/10.1109/icrito.2018.8748636
Autor:
Namita Arya, Amit Prakash Singh
Publikováno v:
2018 2nd International Conference on Inventive Systems and Control (ICISC).
In this paper a stuck-at-fault avoidance approach in combinational VLSI circuits using genetic algorithm (GA) by comparing two complementary circuits has been proposed. Analysis of whole test set generation for a fault model helps to reduce the fault
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b193276b986f7ff4342f3c21fcd0be0e
https://doi.org/10.1109/icisc.2018.8399045
https://doi.org/10.1109/icisc.2018.8399045
Autor:
R. L. Yadav, T. K. Srivastava, Archna Suman, Namita Arya, K. P. Singh, Pushpa Singh, R. K. Rai
Publikováno v:
Communications in Soil Science and Plant Analysis. 46:454-475
Poor sugarcane ratoon yields in the subtropics are responsible for decrease in overall productivity and poor sugar recovery. The present work is an attempt to assess reasons for decline in crop productivity despite providing adequate inputs. The simu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d278038e258e7968b9e2e0379ab6b9f8
https://doi.org/10.1080/00103624.2014.997385
https://doi.org/10.1080/00103624.2014.997385
Autor:
Namita Arya, Amit Prakash Singh
Publikováno v:
ICACCI
The integration level in today's word is continuously increasing in VLSI chips. So that complexity of testing is a major challenge. That is because the internal chip modules have become increasingly midcult to access. There is a significant amount of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::47b216c8eeca58920b4b7c70e261ae5a
https://doi.org/10.1109/icacci.2017.8125862
https://doi.org/10.1109/icacci.2017.8125862
Autor:
T. K. Srivastava, R. L. Yadav, Archna Suman, Pushpa Singh, Namita Arya, K. P. Singh, Asha Gaur, Rama Kant Rai
Publikováno v:
Communications in Soil Science and Plant Analysis. 44:1849-1861
The effects of subsequent sugarcane ratooning on soil quality and the crop yields under four treatments [an absolute control (T0), application of recommended dose of nitrogen (N)–phosphorus (P)–potassium (K) (T1), application of sulfitation press
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a59c561a5b9e1edbe5e2d329275d723
https://doi.org/10.1080/00103624.2013.790402
https://doi.org/10.1080/00103624.2013.790402
Autor:
Namita Arya, Amit Prakash Singh
Publikováno v:
2016 International Conference on Electrical, Electronics, and Optimization Techniques (ICEEOT).
The major causes of board manufacturing defects are: missing components, wrong components, mis-oriented components, broken track (opens), shorted tracks (track-to-track shorts), pin-to-pin solder opens, pin-to-pin solder shorts. To consider the short
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::7674b93eac169dc3ea86c23e561b5e08
https://doi.org/10.1109/iceeot.2016.7754838
https://doi.org/10.1109/iceeot.2016.7754838