Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Nam Kwon Cho"'
Autor:
Kyo-Wang Koo, Seung-Zeon Han, Il-Tae Kang, Hyung-Giun Kim, Sung-Hwan Lim, Jae-Hak Yee, Sangshik Kim, So Yeon Park, Mi-Ri Choi, Nam-Kwon Cho, You-Cheol Jang, Taeg-Woo Lee, Yong-Keun Ahn, Young-Jun Jeon
Publikováno v:
Microelectronics Reliability. 55:2306-2315
We found the failure mechanisms in Ag wire bonded to Al pads during the high-temperature-storage lifetime test (HTST) and the unbiased highly-accelerated temperature and humidity storage test (uHAST). The native oxide layer on the Al pads caused a ba
Autor:
Hyoung Dong Kim, Jae Hak Yee, Nam Kwon Cho, Yeo Chan Ko, Mi Ri Choi, Hyung Giun Kim, You Cheol Jang, Il Tae Kang, So Yeon Park, Sung Hwan Lim, Kyo Wang Koo
Publikováno v:
2014 IEEE 16th Electronics Packaging Technology Conference (EPTC).
Silver wires have become a novel bonding material in recent years. But users & field engineers are still divided over the issue of reliability performance including failure mechanism and intermetallic compounds (IMCs) formation. In this study, new ty
Publikováno v:
Journal of the Society for Information Display. 16:759
— A novel flat discharge fluorescent lamp used as the light source of backlight modules for LCDs and general lighting systems has been researched and developed. This new type of lamp is a less-mercury flat fluorescent lamp with two-dimensional emis