Malcolm, Dominic, Jon Gemmell, and Nalin Mehta , eds. The Changing Face of Cricket: From Imperial to Global Game . Sport in the Global Society-Contemporary Perspectives Series . : Routledge , 2010 . Pp. xv+285 . Notes, abstracts, and index. £80.00 cb.

Autor: Horne, John D.

Publikováno v: Journal of Sport History, 2011 Oct 01. 38(3), 514-516.

Externí odkaz: https://www.jstor.org/stable/10.5406/jsporthistory.38.3.514

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Reactive plasma cleaning and restoration of transition metal dichalcogenide monolayers

Autor: Daniil Marinov, Jean-François de Marneffe, Quentin Smets, Goutham Arutchelvan, Kristof M. Bal, Ekaterina Voronina, Tatyana Rakhimova, Yuri Mankelevich, Salim El Kazzi, Ankit Nalin Mehta, Pieter-Jan Wyndaele, Markus Hartmut Heyne, Jianran Zhang, Patrick C. With, Sreetama Banerjee, Erik C. Neyts, Inge Asselberghs, Dennis Lin, Stefan De Gendt

Publikováno v: npj 2D Materials and Applications, Vol 5, Iss 1, Pp 1-10 (2021)

Abstract The cleaning of two-dimensional (2D) materials is an essential step in the fabrication of future devices, leveraging their unique physical, optical, and chemical properties. Part of these emerging 2D materials are transition metal dichalcoge

Externí odkaz: https://doaj.org/article/f7264bb1bbb04927a645eab375c746fc

Direct Assessment of Defective Regions in Monolayer MoS2 Field-Effect Transistors through In Situ Scanning Probe Microscopy Measurements.

Autor: Minj, Albert, Mootheri, Vivek, Banerjee, Sreetama, Nalin Mehta, Ankit, Serron, Jill, Hantschel, Thomas, Asselberghs, Inge, Goux, Ludovic, Kar, Gouri Sankar, Heyns, Marc, Lin, Dennis H. C.

Publikováno v: ACS Nano; 4/16/2024, Vol. 18 Issue 15, p10653-10666, 14p

Direct Assessment of Defective Regions in Monolayer MoS 2 Field-Effect Transistors through In Situ Scanning Probe Microscopy Measurements.

Autor: Minj A; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Mootheri V; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Department of Materials, KU Leuven, Kapeldreef 75, 3001 Leuven, Belgium., Banerjee S; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Nalin Mehta A; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Serron J; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Hantschel T; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Asselberghs I; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Goux L; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Kar GS; IMEC, Kapeldreef 75, 3001 Leuven, Belgium., Heyns M; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.; Department of Materials, KU Leuven, Kapeldreef 75, 3001 Leuven, Belgium., Lin DHC; IMEC, Kapeldreef 75, 3001 Leuven, Belgium.

Publikováno v: ACS nano [ACS Nano] 2024 Apr 16; Vol. 18 (15), pp. 10653-10666. Date of Electronic Publication: 2024 Apr 01.