Zobrazeno 1 - 6
of 6
pro vyhledávání: '"Nak-Won Yoo"'
Publikováno v:
Journal of Digital Contents Society. 20:165-169
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cf12433981c7a0bcf9e9e396bfa4538a
https://doi.org/10.9728/dcs.2019.20.1.165
https://doi.org/10.9728/dcs.2019.20.1.165
Publikováno v:
Journal of nanoscience and nanotechnology. 20(8)
In this paper, we propose a method to detect thermal transport suitable in nanometers scale. It is feasible using the GIDL-biased MOSFET as thermal sensor. It is because the GIDL current is occurred due to the band-to-band tunnelling of the electron
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::ffbf0a82685942634379adc6fb20ebbb
https://pubmed.ncbi.nlm.nih.gov/32126685
https://pubmed.ncbi.nlm.nih.gov/32126685
Publikováno v:
IEEE Transactions on Electron Devices. 65:3915-3921
We report a method and an experiment to directly estimate the phonon energy generated by hot electrons during the MOSFET operation. By measuring the gate-induced drain leakage (GIDL) current of the MOSFET (as a phonon sensor), we were able to measure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ef9ce50368503260851fb865d97f453
https://doi.org/10.1109/ted.2018.2855976
https://doi.org/10.1109/ted.2018.2855976
Publikováno v:
Applied optics. 58(22)
We propose a method to improve the axial response of structured illumination microscopy via selection of an illumination pattern with a sinusoidal or square wave within the cutoff frequency of the imaging system. Residual modulation within a sectione
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7d41e219339d645508a864b73267cafc
https://pubmed.ncbi.nlm.nih.gov/31503934
https://pubmed.ncbi.nlm.nih.gov/31503934
Publikováno v:
Optical Engineering. 58:1
Our structured illumination microscopy (SIM) is based on a spatial light modulator (SLM) instead of an illumination mask, which does not need to be attached to a linear stage. This SIM can easily design the period of the one-dimensional grid related
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5adf367a4427fdd9f6dd971f7463aac9
https://doi.org/10.1117/1.oe.58.9.094102
https://doi.org/10.1117/1.oe.58.9.094102
Publikováno v:
Optical Engineering; Sep2019, Vol. 58 Issue 9, p094102-1-094102-8, 8p