Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Nak-Kyu Park"'
Publikováno v:
Journal of the Optical Society of Korea. 17:323-327
A laser ultrasonic inspection system has the advantage of nondestructive testing. It is a non-contact mode using a laser interferometer to measure the vertical displacement of the surface of a material caused by the propagation of ultrasonic signals
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::753115cb24a6289f375db41a9010155d
https://doi.org/10.3807/josk.2013.17.4.323
https://doi.org/10.3807/josk.2013.17.4.323
Publikováno v:
Journal of the Korean Society for Nondestructive Testing. 33:160-164
A laser ultrasonic inspection system is a non-contact inspection device which generates and measures ultrasonics by using laser beam. A laser ultrasonic inspection system provides a high measurement resolution because the ultrasonic signal generated
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f8e20cfd63873ace78130dd264543d97
https://doi.org/10.7779/jksnt.2013.33.2.160
https://doi.org/10.7779/jksnt.2013.33.2.160
Autor:
Young-Kyoung Choi, Young-Jung Choi, Nak-Kyu Park, Ju-Hwan Shon, Chulwoo Kim, Ki-Han Kim, Byong-Tae Chung, Hyun-woo Lee, Kwan-Weon Kim
Publikováno v:
ISSCC
A 512 Mbit consumer DDR2 SDRAM that uses self-dynamic voltage scaling (SDVS) and adaptive design techniques is introduced in this paper. With the increase in the significance of process variation, higher performance requirements reduce the allowable
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::315f6b1081199863686488c7575b9ac8
https://doi.org/10.1109/jssc.2011.2164710
https://doi.org/10.1109/jssc.2011.2164710
A 1.6V 1.4Gb/s/pin consumer DRAM with self-dynamic voltage-scaling technique in 44nm CMOS technology
Autor:
Hyun-Woo Lee, Ki-Han Kim, Young-Kyoung Choi, Ju-Hwan Shon, Nak-Kyu Park, Kwan-Weon Kim, Chulwoo Kim, Young-Jung Choi, Byong-Tae Chung
Publikováno v:
2011 IEEE International Solid-State Circuits Conference.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::51b8599581553766a24c6ab362c1712a
https://doi.org/10.1109/isscc.2011.5746416
https://doi.org/10.1109/isscc.2011.5746416
Autor:
Hyung-Wook Moon, Won-Joo Yun, Jae-Suck Kang, Sujeong Sim, Sang-hoon Shin, Seung-Wook Kwack, Hyun-woo Lee, Shin-Deok Kang, Kwan-Weon Kim, Jong-Jin Lee, Hyeng-Ouk Lee, Won Jun Choi, Nak-Kyu Park, Byong-Tae Chung, Young-Kyoung Choi, Hyang-Hwa Choi, Jung-Woo Lee, Young-Jung Choi, Keun-Soo Song, Dong Uk Lee, Ki-Han Kim, Jin-Hong Ahn, Ji Yeon Yang, Young Ju Kim
Publikováno v:
ISSCC
As the speed of DRAM increases and the applications spread, DLLs for DRAM require low-jitter characteristics as well as wide operating range in frequency and voltage domains. Even though digital DLLs have improved jitter control schemes [1,2,4], it i
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3e2e286b65c62e3836c96bc0c173b61
https://doi.org/10.1109/isscc.2009.4977347
https://doi.org/10.1109/isscc.2009.4977347
Autor:
Jin-Hong Ahn, Byong-Tae Chung, Cheul-Hee Koo, Keun-Soo Song, Young-Jung Choi, Kwan-Weon Kim, Nak-Kyu Park
Publikováno v:
2008 IEEE Asian Solid-State Circuits Conference.
In this paper, we report a single-loop delay-locked loop (DLL) using a novel OR-AND duty-cycle correction (DCC) circuit. The proposed OR-AND DCC circuit employs both an analog blocks to detect duty error precisely and a digital block to control duty-
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d929252200426ff6562ccb2dfb32320b
https://doi.org/10.1109/asscc.2008.4708774
https://doi.org/10.1109/asscc.2008.4708774
Autor:
Young-Jung Choi, Byong-Tae Chung, Jin-Hong Ahn, Ki-Han Kim, Jong-Jin Lee, Hyun-woo Lee, Kwan-Weon Kim, Won-Joo Yun, Nak-Kyu Park
Publikováno v:
2008 IEEE Asian Solid-State Circuits Conference.
A new low power and high performance robust digital delay locked loop is presented. The DLL has dual loops with single replica block, different-type dual DCC at input and output, replay mode function, rising edge scanner and self-calibrated power dow
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4886ee8287b0f8271d456a6a8eb44774
https://doi.org/10.1109/asscc.2008.4708773
https://doi.org/10.1109/asscc.2008.4708773
Autor:
Sang-hoon Shin, Dongsuk Shin, Shin Deok Kang, Won-Joo Yun, Keun Soo Song, Ye Seok Yang, Dong Uk Lee, Won Jun Choi, Jin-Hong Ahn, Hyang Hwa Choi, Hyeng Ouk Lee, Nak Kyu Park, Sujeong Sim, Seung Wook Kwack, Young Ju Kim, Ji Yeon Yang, Hyung Wook Moon, Hyun-woo Lee, Kwan-Weon Kim, Young Kyoung Choi, Jung-Woo Lee, Young Jung Choi
Publikováno v:
ISSCC
We design a DLL that has a slew-rate controlled duty-cycle-correction (DCC) with a fully digital controlled duty-cycle-error detector and has the update gear circuit to shift update mode for low power consumption. The DLL is composed of a dual loop a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4b6e0d0fb4f9670bb5ee6c1eea2be2c2
https://doi.org/10.1109/isscc.2008.4523167
https://doi.org/10.1109/isscc.2008.4523167
Autor:
Ye Seok Yang, Dong Uk Lee, Jung-Woo Lee, Shin Deok Kang, Young Jung Choi, Hyun-woo Lee, Kwan-Weon Kim, Sang-hoon Shin, Young Kyoung Choi, Nak Kyu Park, Won-Joo Yun, Hyeong Ouk Lee, Seung Wook Kwack
Publikováno v:
ISSCC
In this work, a multi-slew-rate output driver is developed to cope with the supply voltage variation and the different I/O component capacitance (denoted by CIO) condition. For accurate data transfer, it is necessary to reduce the design loss in the
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a44c495b7d801bb6c899f6bd914cc964
https://doi.org/10.1109/isscc.2008.4523166
https://doi.org/10.1109/isscc.2008.4523166
Autor:
Weon Jae Ryu, Nak Kyu Park, Kyung Suk Kim, Dong Pyo Hong, Young June Kang, Seong-Jong Kim, Man Young Choi
Publikováno v:
SPIE Proceedings.
Laser interferometry is widely used as a measuring system in many fields because of its high resolution and ability to measure a broad area in real-time all at once. In conventional LASER interferometry, for example Out-of-plane ESPI(Electronic Speck
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5ef2a2958bce75e124db937b067967a8
https://doi.org/10.1117/12.754586
https://doi.org/10.1117/12.754586