Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Nai Chung Kang"'
Autor:
Huan Yu Shen, Chin Pang Chen, Hsiang Chen, Hung Wei Chang, Li Chen Chu, Yu Cheng Chu, Nai Chung Kang, Ming Ling Lee, Kow-Ming Chang, Shih-Chang Shei
Publikováno v:
Vacuum. 118:13-16
GaP-based light emitting diodes (LEDs) reliability tests are crucial to further development for high-performance LED lighting technology. In this study, we perform reverse-bias stress tests for LEDs in water vapor and salty water vapor ambient, respe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3fb3fed5d27c7b5940f618bf552451fa
https://doi.org/10.1016/j.vacuum.2014.11.004
https://doi.org/10.1016/j.vacuum.2014.11.004
Autor:
Hung Wei Chang, Shih–Chang Shei, Hung–Che Lai, Huan Yu Shen, Hsiang Chen, Yu Cheng Chu, Nai Chung Kang
Publikováno v:
International Journal of Nanotechnology. 12:38
Reliability tests of GaN near UV light–emitting diodes (LED) were investigated by reverse–bias stress in water vapour. Various electrical, optical and material characterisations were performed to examine degradation trend and failure mechanism. O
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf6cb6a6786c6d24ab84d3fba1b550c4
https://doi.org/10.1504/ijnt.2015.066192
https://doi.org/10.1504/ijnt.2015.066192