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Autor:
Kevin Houchens, Yaniv Abramovitz, Shay Attal, Ofer Adan, Nahum Bomshtein, Itai Buks, Ryan Hsieh, Tal Itzkovich, Jenny Perry
Publikováno v:
Metrology, Inspection, and Process Control XXXVII.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0215436b7d6db8b0ca7b6d39d38e8e37
https://doi.org/10.1117/12.2669984
https://doi.org/10.1117/12.2669984
