Zobrazeno 1 - 10
of 608
pro vyhledávání: '"Nagler B"'
Autor:
Amouretti, A., Crépisson, C., Azadi, S., Cabaret, D., Campbell, T., Chin, D. A., Colin, B., Collins, G. R., Crandall, L., Fiquet, G., Forte, A., Gawne, T., Guyot, F., Heighway, P., Lee, H., McGonegle, D., Nagler, B., Pintor, J., Polsin, D., Rousse, G., Shi, Y., Smith, E., Wark, J. S., Vinko, S. M., Harmand, M.
We present in-situ x-ray diffraction and velocity measurements of Fe$_2$O$_3$ under laser shock compression at pressures between 38-116 GPa. None of the phases reported by static compression studies were observed. Instead, we observed an isostructura
Externí odkaz:
http://arxiv.org/abs/2402.18432
Autor:
Win AK, Walters RJ, Buchanan DD, Jenkins MA, Sweet K, McKeone DM, Walsh MD, Clendenning M, Pearson SA, Pavluk E, Nagler B, Hopper JL, Walker N, Rosty C, Parry S, Young JP
Publikováno v:
Hereditary Cancer in Clinical Practice, Vol 10, Iss Suppl 2, p A21 (2012)
Externí odkaz:
https://doaj.org/article/8f0601383fdb4ec88bb87fe9576aa852
Autor:
Buchanan DD, Win AK, Walters R, Walsh MD, Clendenning M, Nagler B, Pavluk E, Pearson SA, Rosty C, Maskiell J, Hopper JL, Jenkins MA, Young JP
Publikováno v:
Hereditary Cancer in Clinical Practice, Vol 10, Iss Suppl 2, p A23 (2012)
Externí odkaz:
https://doaj.org/article/f97a85b1a8dc4d72b337e28bf18df74f
Autor:
Pandolfi, S., Brown, S. Brennan, Stubley, P. G., Higginbotham, A., Bolme, C. A., Lee, H. J., Nagler, B., Galtier, E., Sandberg, R., Yang, W., Mao, W. L., Wark, J. S., Gleason, A.
Silicon (Si) is one of the most abundant elements on Earth, and it is the most important and widely used semiconductor, constituting the basis of modern electronic devices. Despite extensive study, some properties of Si remain elusive. For example, t
Externí odkaz:
http://arxiv.org/abs/2106.06108
Autor:
Humphries, O. S., Marjoribanks, R. S., Berg, Q. van den, Galtier, E. C., Kasim, M. F., Lee, H. J., Miscampbell, A. J. F., Nagler, B., Royle, R., Wark, J. S., Vinko, S. M.
Publikováno v:
Phys. Rev. Lett. 125, 195001 (2020)
The development of high-brightness free-electron lasers (FEL) has revolutionised our ability to create and study matter in the high-energy-density (HED) regime. Current diagnostic techniques have been very successful in yielding information on fundam
Externí odkaz:
http://arxiv.org/abs/2001.05813
Autor:
Williams, Gareth O., Chung, H. -K., Künzel, S., Hilbert, V., Zastrau, U., Scott, H., Daboussi, S., Iwan, B., Gonzalez, A. I., Boutu, W., Lee, H. J., Nagler, B., Granados, E., Galtier, E., Heimann, P., Barbrel, B., Lee, R. W., Cho, B. I., Renaudin, P., Merdji, H., Zeitoun, Ph., Fajardo, M.
Publikováno v:
Phys. Rev. Research 1, 033216 (2019)
Degenerate plasmas, in which quantum effects dictate the behavior of free electrons, are ubiquitous on earth and throughout space. Transitions between bound and free electron states determine basic plasma properties, yet the effects of degeneracy on
Externí odkaz:
http://arxiv.org/abs/1902.07052
Autor:
White, S., Kettle, B., Lewis, C. L. S., Riley, D., Vorberger, J., Glenzer, S. H., Gamboa, E., Nagler, B., Tavella, F., Lee, H. J., Murphy, C. D., Gericke, D. O.
Publikováno v:
Phys. Rev. Research 2, 033366 (2020)
Using the LCLS facility at the SLAC National Accelerator Laboratory, we have observed X-ray scattering from iron compressed with laser driven shocks to Earth-core like pressures above 400GPa. The data shows shots where melting is incomplete and we ob
Externí odkaz:
http://arxiv.org/abs/1811.09467
Autor:
McBride, E. E., White, T. G., Descamps, A., Fletcher, L. B., Appel, K., Condamine, F., Curry, C. B., Dallari, F., Funk, S., Galtier, E., Gauthier, M., Goede, S., Kim, J. B., Lee, H. J., Ofori-Okai, B. K., Oliver, M., Rigby, A., Schoenwaelder, C., Sun, P., Tschentscher, Th., Witte, B. B. L., Zastrau, U., Gregori, G., Nagler, B., Hastings, J., Glenzer, S. H., Monaco, G.
We describe a setup for performing inelastic X-ray scattering measurements at the Matter in Extreme Conditions (MEC) endstation of the Linac Coherent Light Source (LCLS). This technique is capable of performing high-, meV-resolution measurements of d
Externí odkaz:
http://arxiv.org/abs/1806.02398
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