Zobrazeno 1 - 10
of 33
pro vyhledávání: '"Nagendra Gajjar"'
Autor:
Jayesh Diwan, Nagendra Gajjar
Publikováno v:
International Journal of Electrical and Electronics Research. 11:84-89
In recent times, synchronous circuits are facing design related issues like clock skew, glitch power, EMI, leakage power, etc. The clock-less design paradigm – Asynchronous design challenges most of these issues and accepted as a better alternative
Autor:
Saravana Kumar B, Nagendra Gajjar
Publikováno v:
International Journal of Electrical and Electronics Engineering. 10:44-51
Publikováno v:
International Journal of Electrical and Electronics Engineering. 10:67-72
Publikováno v:
2023 7th International Conference on Trends in Electronics and Informatics (ICOEI).
Publikováno v:
2023 7th International Conference on Trends in Electronics and Informatics (ICOEI).
Publikováno v:
2023 International Conference on Device Intelligence, Computing and Communication Technologies, (DICCT).
Autor:
Gargee Vaidya, Shreya Chandrasekhar, Ruchi Gajjar, Nagendra Gajjar, Deven Patel, Manish Banker
Publikováno v:
The Open Biomedical Engineering Journal. 15:190-203
Background: The process of In Vitro Fertilization (IVF) involves collecting multiple samples of mature eggs that are fertilized with sperms in the IVF laboratory. They are eventually graded, and the most viable embryo out of all the samples is select
Autor:
Nagendra Gajjar, Stavan Ruparelia, Vaibhavkumar Jigneshkumar Thakor, Nikhilkumar Pareshbhai Patel, Ruchi Gajjar
Publikováno v:
The Visual Computer. 38:2923-2938
Early identification of crop disease can aid the farmers to take timely precautions and countermeasures for its removal. In this paper, a real-time system to identify the type of disease present in a crop based on leaf images using machine learning i
Publikováno v:
Communications in Computer and Information Science ISBN: 9783031213847
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::21015446c3f63a403a6957e985ac3bd4
https://doi.org/10.1007/978-3-031-21385-4_21
https://doi.org/10.1007/978-3-031-21385-4_21
Autor:
Nagendra Gajjar, Dharmendrakumar Patel
Publikováno v:
2021 IEEE Madras Section Conference (MASCON).
The conventional 6T SRAM is susceptible to soft error in the radiation environment. To overcome this limitation several rad-hard SRAM Bit Cells have been presented. In this paper, QUATRO10T, QUCCE10T and RHBD10T cells have been implemented, analyzed