Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Nagaraj Vannal"'
Autor:
Nagaraj Vannal, Saroja V. Siddamal
Publikováno v:
Advances in Science, Technology and Engineering Systems Journal. 5:937-943
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a47a3d552033532eba3be6e7b2848431
https://doi.org/10.25046/aj0506111
https://doi.org/10.25046/aj0506111
Publikováno v:
2016 IEEE 4th International Conference on MOOCs, Innovation and Technology in Education (MITE).
There is a need to prepare engineering students for the future world to be good engineers, to be a good engineer the theoretical background of the curriculum that they go through is not sufficient they need to practice what they have understood. In o
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::58003768e607286db0180607cf790302
https://doi.org/10.1109/mite.2016.057
https://doi.org/10.1109/mite.2016.057
Publikováno v:
Journal of Engineering Education Transformations.
All most all modern electronics devices such as smart phones and laptops depend on concepts derived from digital electronics. In fact, most electronics about the industry and in home depend on digital electronics to work. To consider for forth coming
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1e34fcb93fdf86e08aa1d2d01ca98dcb
https://doi.org/10.16920/jeet/2016/v0i0/85626
https://doi.org/10.16920/jeet/2016/v0i0/85626
Publikováno v:
2015 Fifth International Conference on Communication Systems and Network Technologies.
In Very Large Scale Integration (VLSI), while manufacturing IC, Test time and cost plays a very significant role. If faulty components find during IC manufacture then cost increases. So it is essential to minimize test time and cost. In this paper Bu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::73a445f8034ee1fa05bb66318410d7f6
https://doi.org/10.1109/csnt.2015.151
https://doi.org/10.1109/csnt.2015.151