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pro vyhledávání: '"Naga Babu Koganti"'
Autor:
Raghav Khanna, Zhi-Hong Mao, Ansel Barchowsky, Gregory F. Reed, Michael R. Hontz, William E. Stanchina, Naga Babu Koganti, Joseph P. Kozak
Publikováno v:
IEEE Journal of Emerging and Selected Topics in Power Electronics. 8:99-110
Recently, a major challenge in the adoption of wide bandgap semiconductors for power electronic applications is the need to trade device performance for device safety. In this article, methods for predicting gate voltage overshoot in normally-OFF gal
Publikováno v:
NAECON 2018 - IEEE National Aerospace and Electronics Conference.
This paper investigates the impact of an external control-FET gate resistance on the spuriously induced synchronous-FET gate voltage in a 1 MHz point-of-load buck converter. An analytical circuit model with intrinsic device components and external pa