Zobrazeno 1 - 4
of 4
pro vyhledávání: '"Nag Mahadevan"'
Autor:
Gabor Karsai, Nag Mahadevan, Arthur F. Witulski, Andrew Sternberg, Jeff Kauppila, Philippe Adell, Harald Schone, Ronald D. Schrimpf
Publikováno v:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Autor:
Ronald D. Schrimpf, Gabor Karsai, A. Privat, Robert A. Reed, Nag Mahadevan, Jeffrey S. Kauppila, A. Daniel, Andrew L. Sternberg, Hugh J. Barnaby, Philippe C. Adell, H. Schone, A. F. Witulski
Publikováno v:
IEEE Transactions on Nuclear Science. 66:1634-1641
A simulation paradigm is proposed to examine the effects of transistor-level degradation produced by total ionizing dose (TID) on top-level system performance parameters. The approach is demonstrated on a command and data handling (C&DH) board for de
Autor:
Robert A. Reed, Jonathan Pellish, Peter J. Majewicz, Arthur F. Witulski, Nag Mahadevan, Gabor Karsai, Brian D. Sierawski, Ronald D. Schrimpf, John J. Evans, Michael J. Campola, Rebekah Austin
Publikováno v:
2020 IEEE Aerospace Conference.
This work describes one step towards automating the development of assurance cases for systems in radiation environments. The Systems Engineering Assurance and Modeling Platform (SEAM) developed by Vanderbilt and NASA is extended to automatically cro
Autor:
Andrew L. Sternberg, Ronald D. Schrimpf, A. F. Witulski, Michael W. McCurdy, D. Sheldon, Nag Mahadevan, M. B. Smith, C. Barnes, Gabor Karsai
Publikováno v:
2017 17th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Threshold voltage variation with ionizing dose was measured for a commercial power MOSFET. Variation of radiation response was captured using a Bayesian linear model, which enabled a Monte Carlo simulation of variation in circuit performance.